Low-Cost Analog/RF IC Testing through Combined Intra- and Inter-Die Correlation Models

Huang, Ke; Kupp, Nathan; Xanthopoulos, Constantinos; Carulli, John M.; Makris, Yiorgos

doi:10.1109/mdat.2014.2361721

Cited by 10 publications

(10 citation statements)

References 13 publications

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“…The novel investigation method proposed by this research serves as an efficient and low-cost testing method for the S 21 detection circuit. As introduced in Section 1, related works in various domains [12][13][14][15][16][17][18][19][20][21][22][23][24] have provided valuable inspiration and knowledge for the development of the method. Because the investigation method is particularly designed for the S 21 detection circuit, counterparts highly comparable with the method seem to be absent in the literature.…”

Section: Comparisons With Past Workmentioning

confidence: 99%

“…Moreover, diverse works [20][21][22][23][24] have demonstrated intelligent strategies to analyze the performance of ICs. In [20], Bandler proposed the concept of network decomposition, which views a large network as mutually uncoupled subnetworks.…”

Section: Introductionmentioning

confidence: 99%

“…In [22], Ellouz used internal DC node voltages to estimate RF parameters. In [23], Huang employed machine-training techniques to reduce the excessive costs of specification testing in analog and RF circuits. In [24], Subramani demonstrated the exploration of the activation energy and cross section of the traps by using a more economical method.…”

Section: Introductionmentioning

confidence: 99%

“…The above great works [12][13][14][15][16][17][18][19][20][21][22][23][24] inspired this research to propose a novel investigation method for the S 21 detection circuit.…”

Section: Introductionmentioning

confidence: 99%

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A Novel Investigation Method for the S21 Detection Circuit

Lee

2020

Int. j. eng. technol. innov.

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This research proposes a novel method to investigate the performance of the S21 detection circuit. Aiming at low frequencies or DC, the method serves as an efficient way of verification and enjoys the benefit of low testing costs. The novel investigation method is demonstrated at 50 MHz and verified by the scattering parameters at 11.05 GHz. Based on the investigation, a model of process variations is constructed. The length of the interface paths is estimated by the model to be 63µm, which is consistent with the corresponding length of 74.6µm in the layout. For the measured phase and magnitude, the model indicates that the process variations in the device under test cause errors of 18.91% and 1.27%, whereas those in the interface paths lead to errors of 1.83% and 1%. Based on the model, practical recommendations are also proposed to further improve the measurement precision in the future.

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Section: Comparisons With Past Workmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

“…The above great works [12][13][14][15][16][17][18][19][20][21][22][23][24] inspired this research to propose a novel investigation method for the S 21 detection circuit.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

A Novel Investigation Method for the S21 Detection Circuit

Lee

2020

Int. j. eng. technol. innov.

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show abstract

“…Alternate testing techniques require a mapping between the specification space and the measurements space in order to allow the test decision to be performed. Artificial intelligence [14] and regression techniques [13], [15], [16] have been used with successful results to this purpose, as well as using octrees to represent the pass/fail regions [17], [18]. In this paper, octree data structures are used to encode the specification bins in the alternate measurements space.…”

mentioning

confidence: 99%