2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis 2009
DOI: 10.1109/cas-ictd.2009.4960835
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Low-Cost BISDC Design for Motion Estimation Computing Array

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“…However, increasingly complex density of circuitry requires that the built-in testing approach not only detect faults but also specify their locations for error correcting. Thus, extended schemes of BIST referred to as built-in self-diagnosis [11] and built-in self-correction [12]- [14] have been developed recently.…”
Section: Introductionmentioning
confidence: 99%
“…However, increasingly complex density of circuitry requires that the built-in testing approach not only detect faults but also specify their locations for error correcting. Thus, extended schemes of BIST referred to as built-in self-diagnosis [11] and built-in self-correction [12]- [14] have been developed recently.…”
Section: Introductionmentioning
confidence: 99%