Low-Cost Digital Detection of Parametric Faults in Cascaded $\Sigma\Delta$ Modulators

Abstract

Abstract-The test of Σ∆ modulators is cumbersome due to the high performance they reach. Moreover, technology scaling trends raise serious doubts on the intra-die repeatability of devices. Increase of variability will lead to an increase in parametric faults difficult to detect. In this paper, a designoriented testing approach is proposed to perform simple and low-cost detection of variations in important design variables of cascaded Σ∆ modulators. The digital tests could be integrated in a production test flow to improve fault coverage and bring data for silicon debug. A study is presented to tailor signature generation, with test time minimization in mind, as function of the desired measurement precision. The developments are supported by experimental results that validate the proposal.

Fault detection reduced-order filter design for discrete-time Markov jump system with deficient transition information

“…Then, we replace matrices M i given by (24) into (19); together with the admissible filter parameter, matrices are defined in (25) and (26). Finally, we can get (14) exactly.…”

Multi-condition alternate test of analog, mixed-signal, and RF systems

“…B. Mixed-signal domain: Digital test of a 2-1 cascaded L:� modulator 1) Description of the alternate test strategy: In order to validate the approach in a much different circuit, we have re used past work on digital tests for L:� converters [4]. These digital tests provide simple signatures that can be used to feed a regression model.…”

(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

“…On the other hand, in [15,16], tester resources are alleviated by measuring N devices and, from them, building an empirical model by resorting to a non-linear regression method. Finally, within this group we have to mention to methods that develope a behavioral model, like [17][18][19]. The main idea in this case is to translate complex performance specifications into some parameters which can be tested with a lower effort.…”