In this paper, we report on the interest in a new polymer, UV210, in the field of integrated optics. As 400 nm
wide and 1 µm
high UV210 rib waveguides have been obtained by deep ultraviolet (DUV) lithography and
controlled by scanning electron micrographs (SEMs), they allow us to realize
sub-wavelength structures by way of easy and cheap processes. Structural and optical
investigations have been carried out on UV210 resist as a function of exposure to DUV
light. On the one hand, structural properties through ellipsometric measurements have
been investigated: the UV210 refractive index increases with the DUV exposure
dose, yielding a large index contrast at 980 nm between areas exposed or not (Δn = 2 × 10 − 2). It is expected that we shall soon be able to photo-print nanometric patterns onto UV210
films. On the other hand, optical studies of propagation losses measured in both
irradiated and unexposed single-mode UV210 waveguides have been performed by
a cut-back method. Concerning as-deposited rib waveguides, optical losses for
TE00 and
TM00 optical modes have
been evaluated to 3.4 ± 0.4 dB cm − 1
and 6.2 ± 0.5 dB cm − 1, respectively. Hence, the UV210 polymer appears to be a promising candidate
for the development of low-cost nanometric structures for miniaturized optical
chips, with numerous applications in telecommunication and sensor technology.