Mechanical strain engineering has been promising for many integrated photonic applications. However, for the engineering of material electronic bandgap, a trade-off exists between the strain uniformity and the integration compatibility with photonic-integrated circuits (PICs). Herein, we adopted a straightforward recess-type design of silicon nitride (SiN x ) stressor to achieve a uniform strain with enhanced magnitude in the material of interest on PICs. Normal-incidence, uniformly 0.56%-tensile strained germanium (Ge)-on-insulator (GOI) metal-semiconductor-metal photodiodes were demonstrated, using the recessed stressor with 750-MPa tensile stress. The device exhibits a responsivity of 1.84±0.15 A/W at 1,550 nm. The extracted Ge absorption coefficient is enhanced by ~3.2× to 8,340 cm -1 at 1,612 nm and is superior to that of In 0.53 Ga 0.47 As up to 1,630 nm limited by measurement spectrum. Compared to the non-recess strained device, additional absorption coefficient improvement of 10-20% in the C-band and 40-60% in the L-band were observed. This work facilitates the recess-strained GOI photodiodes for free-space PIC applications and paves the way for various (e.g. Ge, GeSn or III-V based) uniformly strained photonic devices on PICs.