1989
DOI: 10.1063/1.343600
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Low frequency and microwave characterization of submicron-gate In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As heterojunction metal-semiconductor field-effect transistors grown by molecular-beam epitaxy

Abstract: Doped-channel i-In0.52Al0.48As/n+-In0.53Ga0.47 As/i-In0.52Al0.48As heterojunction metal-semiconductor field-effect transistors lattice matched to the InP substrates with gate lengths in the submicron range have been fabricated and characterized. The dc and microwave performance of the devices are presented in this paper. Drain current anomalities, or the kink effects, were observed at room temperatures as well as at 77 K in the dc measurements. The kinks are associated with the deep-level electron trapping, an… Show more

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Cited by 7 publications
(1 citation statement)
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“…The In x Al 1−x As III-V semiconductor alloy has long been established as an important material in both fundamental studies of III-V properties and in a wide range of applications. The ability to lattice-match the InP substrate and In y Ga 1−y As alloy allowed the creation of unstrained heterostructures for field effect and bipolar transistors, as well as optoelectronic applications, including light emitters and photodetectors for communication ranges of the spectrum [1][2][3][4]. The properties of the alloy material grown by wellestablished techniques matched the requirements posed by these applications.…”
Section: Introductionmentioning
confidence: 99%
“…The In x Al 1−x As III-V semiconductor alloy has long been established as an important material in both fundamental studies of III-V properties and in a wide range of applications. The ability to lattice-match the InP substrate and In y Ga 1−y As alloy allowed the creation of unstrained heterostructures for field effect and bipolar transistors, as well as optoelectronic applications, including light emitters and photodetectors for communication ranges of the spectrum [1][2][3][4]. The properties of the alloy material grown by wellestablished techniques matched the requirements posed by these applications.…”
Section: Introductionmentioning
confidence: 99%