2019
DOI: 10.1103/physrevb.100.165305
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Low-frequency charge noise in Si/SiGe quantum dots

Abstract: Electron spins in silicon have long coherence times [1][2][3][4][5][6] and are a promising qubit platform [7,8]. However, electric field noise in semiconductors poses a challenge for most single-and multi-qubit operations in quantum-dot spin qubits [4,9,10]. Here, we investigate the dependence of lowfrequency charge noise spectra on temperature and aluminum-oxide gate dielectric thickness in Si/SiGe quantum dots with overlapping gates. We find that charge noise increases with aluminum oxide thickness. We also … Show more

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Cited by 119 publications
(84 citation statements)
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“…The first spectrum shows a 1/f β behavior, with β = 1.14, which is close to the 1/f behavior expected for a uniform distribution of fluctuating two-level systems (TLSs) in the environment [29]. It is worth noting that the chemical potential fluctuation at 1 Hz is lower than 1 μeV/ √ Hz, which compares favorably with the lowest potential-fluctuation values reported in the literature for silicon, which are in the 2-5 μeV/ √ Hz range at 350 mK [30][31][32]34]. The second spectrum shows a stronger deviation from 1/f noise.…”
Section: B Low-frequency Charge Noise and Static Coulomb Disordersupporting
confidence: 80%
See 1 more Smart Citation
“…The first spectrum shows a 1/f β behavior, with β = 1.14, which is close to the 1/f behavior expected for a uniform distribution of fluctuating two-level systems (TLSs) in the environment [29]. It is worth noting that the chemical potential fluctuation at 1 Hz is lower than 1 μeV/ √ Hz, which compares favorably with the lowest potential-fluctuation values reported in the literature for silicon, which are in the 2-5 μeV/ √ Hz range at 350 mK [30][31][32]34]. The second spectrum shows a stronger deviation from 1/f noise.…”
Section: B Low-frequency Charge Noise and Static Coulomb Disordersupporting
confidence: 80%
“…The second spectrum shows a stronger deviation from 1/f noise. To explain this, we use a more-refined model of charge noise that accounts for a nonuniform distribution of TLS activation energies compared with the temperature [30,33]. S μ is fit with a function of the form S μ = A/f β + B/f 2 /f 2 c + 1.…”
Section: B Low-frequency Charge Noise and Static Coulomb Disordermentioning
confidence: 99%
“…Recently reported values of √ S 1 for charge noise affecting Si/SiGe quantum dots falls into range √ S 1 = S(1 Hz) ≈ 0.2 − 2 µeV/Hz 1/2 [33,36,[65][66][67], with 1/ω behavior of the power spectral density in frequency range ω ∼ t. As we have estimated in the previous Section, such noise is already sufficient to significantly limit the adiabatic transition probability at low and moderate sweep speed. On the other hand, the noiseless Landau-Zener process of nonadiabtic transition becomes relevant at high sweep speed.…”
Section: Resultsmentioning
confidence: 98%
“…Let us notice now that typical order of magnitude of √ S 1 is 1 µeV/Hz 1/2 [33,36,[65][66][67], while maximal detuning sweep velocities allowing for fast and high-probability noiseless transfer for typical t ≈ 10 µeV in Si QDs are of the order of 10-100 µeV/ns. Using these natural units for S 1 and v we have…”
Section: B Analytical Approach To Calculation Of Noise-induced Transmentioning
confidence: 99%
“…Empirically, semiconductor qubits are often limited by 1/f charge noise [30,31,32], which in turn leads to a power spectral density of exchange fluctuations S J (f ) = A 2 J /f . Therefore we will focus on modeling the expected exchange noise amplitude A J ; in Appendix E we discuss the connection between this quantity and γ for different experiments.…”
Section: Tqd Qubit Operation and Key Quantities For Spin-photon Couplingmentioning
confidence: 99%