2006
DOI: 10.1063/1.2209191
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Low-resistivity, stable p-type ZnO thin films realized using a Li–N dual-acceptor doping method

Abstract: A Li–N dual-acceptor doping method has been developed to prepare p-type ZnO thin films by pulsed laser deposition. The lowest room-temperature resistivity is found to be ∼0.93Ωcm, much lower than that of Li or N monodoped ZnO films. The p-type conductivity of ZnO:(Li,N) films is very reproducible and stable, with acceptable crystal quality. The acceptor activation energy in ZnO:(Li,N) is about 95meV. ZnO-based homostructural p-n junctions were fabricated by depositing an n-type ZnO:Al layer on a p-type ZnO:(Li… Show more

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Cited by 159 publications
(79 citation statements)
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“…ZnO: (Li, N) film annealed for 30 min shows a hole concentration of 3.72 9 10 17 cm -3 , hole mobility of 1.82 cm 2 /V s, and resistivity of 10.83 X cm. Compared to other preparation methods, the electrical properties of ZnO: (Li, N) film prepared by IBED are superior to that by RF-magnetron sputtering method [22,23] and plasma-assisted molecular beam epitaxy [24], but inferior to that by pulsed laser deposition method [11,25]. We may draw the conclusion from what has been discussed above: appropriate annealing can eliminate the sputtering damage and improve the crystal quality, and help lithium to incorporate in ZnO lattice and realize the substitutional action.…”
Section: Resultsmentioning
confidence: 89%
“…ZnO: (Li, N) film annealed for 30 min shows a hole concentration of 3.72 9 10 17 cm -3 , hole mobility of 1.82 cm 2 /V s, and resistivity of 10.83 X cm. Compared to other preparation methods, the electrical properties of ZnO: (Li, N) film prepared by IBED are superior to that by RF-magnetron sputtering method [22,23] and plasma-assisted molecular beam epitaxy [24], but inferior to that by pulsed laser deposition method [11,25]. We may draw the conclusion from what has been discussed above: appropriate annealing can eliminate the sputtering damage and improve the crystal quality, and help lithium to incorporate in ZnO lattice and realize the substitutional action.…”
Section: Resultsmentioning
confidence: 89%
“…And most importantly, the p-type conduction lasts over a year, which is far better than monodoping. The improved stability of dual acceptor doping indicates that the formation of compensating defects can be reduced with dual acceptor codoping [155]. XPS data have shown that Li and N are possibly combined to form a Li-N complex with a shallow acceptor level of 126 meV [153].…”
Section: Dual Acceptor Codopingmentioning
confidence: 97%
“…Compared the Q 1 and Q 2 with H2, the Q series have voltage regulator diode rectification property which is different with the same type ZnO p-n junctions (650nm) 18 which is much thicker than our Q series. Therefore the I-V rectification property in the thinner p-n homojunctions could be enhanced and modulated by embed Zn 0.85 Mg 0.15 O ADB structure.…”
Section: Methodsmentioning
confidence: 99%