2022
DOI: 10.1016/j.carbon.2022.04.016
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Low-temperature characteristics of resistive switching memory devices based on reduced graphene oxide-phosphor composites toward reliable cryogenic electronic devices

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Cited by 3 publications
(1 citation statement)
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“…In [34], a resistive switching memristor was manufactured and characterized based on reduced Graphene Oxide (rGO) and Phosphor composites, aiming for a reliable cryogenic electronic device. Two memory structures were explored and compared: an all-oxide IT O/GP/IT O/quartz device and (ii) an IT O/GP/Si3N 4/p ++ Si device.…”
Section: B Cryogenic Memristors Fabrication Materialsmentioning
confidence: 99%
“…In [34], a resistive switching memristor was manufactured and characterized based on reduced Graphene Oxide (rGO) and Phosphor composites, aiming for a reliable cryogenic electronic device. Two memory structures were explored and compared: an all-oxide IT O/GP/IT O/quartz device and (ii) an IT O/GP/Si3N 4/p ++ Si device.…”
Section: B Cryogenic Memristors Fabrication Materialsmentioning
confidence: 99%