Sintering Applications 2013
DOI: 10.5772/53255
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Low Temperature Hybrid Processing Technology of Fine Electronic Ceramics

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Cited by 2 publications
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“…34-0411. 20 The XRD pattern of EG shows a sharp peak at 2q ¼ 26. 3 , which corresponds to the (002) crystal plane.…”
Section: Surface Morphologymentioning
confidence: 99%
See 1 more Smart Citation
“…34-0411. 20 The XRD pattern of EG shows a sharp peak at 2q ¼ 26. 3 , which corresponds to the (002) crystal plane.…”
Section: Surface Morphologymentioning
confidence: 99%
“…34-0411. 20 The XRD pattern of EG shows a sharp peak at 2q ¼ 26.3 , which corresponds to the (002) crystal plane. 16 The nanocomposites show the characteristic peaks of BST and EG and their intensity increases monotonically with the increase in their content.…”
Section: Surface Morphologymentioning
confidence: 99%