Crystalline properties of nickel metalinduced-lateral-crystallized(Ni-MILC) silicon films are examined in detail. Laterally grown crystalline grains can be as large as 19 µm, though the grains consist of small misorientated sub-grains. The excimer laser annealing (ELA) method definitely improves Ni-MILC film quality. As a result, fairly good polysilicon thin film transistors are easily fabricated through a low-temperature process. It is, however, difficult to completely eliminate the subgrains by simply applying the ELA method to Ni-MILC silicon films.