2012
DOI: 10.1111/j.1744-7402.2012.02790.x
|View full text |Cite
|
Sign up to set email alerts
|

Low Vacuum Deposition of Aluminum Nitride Thin Films by Sputtering

Abstract: Conventionally, sputtering deposition of thin films requires a low base pressure (high vacuum) to minimize influences of residual gases. Here, a high base pressure (low vacuum) was used, which can reduce significantly the overall processing time. Aluminum nitride ( AlN ) was selected as a model system of dielectric nitrides. All the analyses revealed that the obtained films under a low vacuum environment within specific processing windows exhibited characteristics similar to those of high‐vacuum made AlN fil… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
5
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 9 publications
(6 citation statements)
references
References 24 publications
1
5
0
Order By: Relevance
“…Similar results were observed in the properties expected for AgInSbTe 10 and B 4 C, 11 but the change in base pressure did not seem to greatly affect the desired properties of nitrides such TiN x O y 12 and AlN. 13 On the other hand, the study of the effect of base pressure on the properties of metal oxides deposited from ceramic targets such as Sn-doped In 2 O 3 (In 2 O 3 :Sn), known as indium-tin oxide (ITO), 14,15 and its better substitute as transparent conductive oxide (TCO), Al-doped ZnO (ZnO:Al), known as aluminum-zinc oxide (AZO), [16][17][18] produced interesting results. In these cases, the authors presented different outcomes regarding the effect of the base pressure on the optical and electrical properties of the deposited films, because most of the properties were studied as a function of three or four points of base pressure.…”
Section: Introductionsupporting
confidence: 76%
“…Similar results were observed in the properties expected for AgInSbTe 10 and B 4 C, 11 but the change in base pressure did not seem to greatly affect the desired properties of nitrides such TiN x O y 12 and AlN. 13 On the other hand, the study of the effect of base pressure on the properties of metal oxides deposited from ceramic targets such as Sn-doped In 2 O 3 (In 2 O 3 :Sn), known as indium-tin oxide (ITO), 14,15 and its better substitute as transparent conductive oxide (TCO), Al-doped ZnO (ZnO:Al), known as aluminum-zinc oxide (AZO), [16][17][18] produced interesting results. In these cases, the authors presented different outcomes regarding the effect of the base pressure on the optical and electrical properties of the deposited films, because most of the properties were studied as a function of three or four points of base pressure.…”
Section: Introductionsupporting
confidence: 76%
“…In reactive sputtering, the deposited thin film is formed by chemical reaction between the target materials and a reactive gas which is introduced into the vacuum chamber. Oxide and nitride films are often fabricated using reactive sputtering [49]. The composition of thin film can be controlled by varying the relative pressures of the inert and reactive gases.…”
Section: Fabrication Of Fto/nano-zno Matrix By Reactive Rf Magnetron mentioning
confidence: 99%
“…The deposited ZnO thin film was prepared by chemical reaction of Zn atoms from the target surface and O 2 reactive gas during reactive sputtering. The metal–metal oxide composition of the nano-ZnO film can be determined by control of the pressure of Ar and O 2 gases (Kelly and Arnell, 2000 ; Baghriche et al, 2012 ; Bijad et al, 2013 ; Yao and Lu, 2013 ; Mozaffari et al, 2014 ).…”
Section: Resultsmentioning
confidence: 99%