2012
DOI: 10.1166/jnn.2012.5626
|View full text |Cite
|
Sign up to set email alerts
|

<I>In-Situ</I> Electrical Conductivity Measurement of Oxidation of Tin Nanocluster Film

Abstract: An in-situ electrical conductivity measurement of thin films of tin oxide nanoclusters for nano-devices was performed during metal cluster deposition and subsequent oxidation. From the current observation, the percolation threshold and the oxidation process are suggested. During baking at 200 degrees C, tin nanoclusters were transformed into low-conductivity stannous oxide and then into high-conductivity stannic oxide. From electron micrographs, it is suggested that the baking procedure is responsible for chan… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 9 publications
0
0
0
Order By: Relevance