1998
DOI: 10.1117/12.323106
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<title>Phase correction in measurement of gauge blocks using a new double-ended interferometer</title>

Abstract: Phase correction in measured lengths of gauge blocks was researched. It has been known that the phase correction depends on the surface roughness of the gauge and the shift of the effective plane of reflection caused by penetration, due to the complex refractive index.We compared measured lengths of gauge blocks between two methods, a new double-ended interferometer and a conventional Kösters' interferometer. The distance between two effective planes of reflection of the gauge block is measured directly using … Show more

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Cited by 6 publications
(4 citation statements)
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“…Leach [8] and Bönsch [9] presented methods of measuring roughness correction based on the measurement of total integrated scatter, while Stoup [10] suggested a spherical contact technique to minimize the errors caused by flatness deviation. Validation of Thwaite's method using a doubleended interferometer and both AFM and stylus instrument methods for surface profile measurements was presented by Ishii [11]. Several experiments regarding phase shift on ceramic gauge blocks, including the cross-wringing method, surface roughness measurements and using the stack method, were presented by Shutoh [12].…”
Section: Methods Of Determining Global Phase Correction Based On Lite...mentioning
confidence: 99%
“…Leach [8] and Bönsch [9] presented methods of measuring roughness correction based on the measurement of total integrated scatter, while Stoup [10] suggested a spherical contact technique to minimize the errors caused by flatness deviation. Validation of Thwaite's method using a doubleended interferometer and both AFM and stylus instrument methods for surface profile measurements was presented by Ishii [11]. Several experiments regarding phase shift on ceramic gauge blocks, including the cross-wringing method, surface roughness measurements and using the stack method, were presented by Shutoh [12].…”
Section: Methods Of Determining Global Phase Correction Based On Lite...mentioning
confidence: 99%
“…For determining the correction for the phase change in reflection, including for both material bulk optical properties and surface roughness, there are several common methods. One method uses literature values for the refractive index of the material and measures surface roughness with a stylus instrument or AFM, with application of Thwaite's [3,6] method. Another option is to use an integrating sphere for phase change due to surface roughness [8,22], and if needed-i.e.…”
Section: Phase Change In Reflectionmentioning
confidence: 99%
“…However, PTB, the NMI in Germany, is planning to build a high accuracy DEI for special applications [2]. Some other laboratories have published research related to doubleended interferometry: Ishii [3,4] used atomic force microscopy (AFM) for surface roughness correction evaluation; Kuriyama [5] used Thwaite's [6] method for phase change correction and claims extremely low uncertainty; and Buchta et al have developed a new version of the Dowell instrument with white light interference for approximate length determination [7]. To date there has been little emphasis on wavefront errors.…”
Section: Introductionmentioning
confidence: 99%
“…A number of studies on DEIs by various authors on different setups mainly concern the effects of phase changes and roughness corrections [17,18] or wavefront corrections [12]. The first two effects can be summarized as surface effects of the gauge block.…”
Section: Introductionmentioning
confidence: 99%