1994
DOI: 10.1117/12.175435
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<title>Practical 0.35-um i-line lithography</title>

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“…Resist users often employ modeling as an aid for new resist evaluations. On the exposure tool side, modeling has become an indispensable part of the optimization of the numerical aperture and partial coherence of a stepper [43][44][45] and in the understanding of the print bias between dense and isolated lines [46]. The use of optical proximity correction software requires rules on how to perform the corrections, which are often generated with the help of lithography simulation [47], or they use lithography models directly for the corrections.…”
Section: B Process Development Toolmentioning
confidence: 99%
“…Resist users often employ modeling as an aid for new resist evaluations. On the exposure tool side, modeling has become an indispensable part of the optimization of the numerical aperture and partial coherence of a stepper [43][44][45] and in the understanding of the print bias between dense and isolated lines [46]. The use of optical proximity correction software requires rules on how to perform the corrections, which are often generated with the help of lithography simulation [47], or they use lithography models directly for the corrections.…”
Section: B Process Development Toolmentioning
confidence: 99%
“…Resist users often employ modeling as an aid for new resist evaluations. On the exposure tool side, modeling has become an indispensable part of the optimization of the numerical aperture and partial coherence of a stepper [50][51][52] and in the understanding ofthe print bias between dense and isolated lines [53]. The use of optical proximity correction software requires rules on how to perform the corrections, which are often generated with the help of lithography simulation [54].…”
Section: Process Development Toolmentioning
confidence: 99%