&lt;title&gt;Pulsed laser deposition of ferroelectric thin films for active microwave electronic devices&lt;/title&gt;

Horwitz, J. S.; Chrisey, Douglas B.; Carter, A. C.; Chang, Wontae; Knauss, L.A.; Pond, J.M.; Kirchoefer, Steven W.; Korn, D.; Qadri, S. B.

doi:10.1117/12.273731

SPIE Proceedings

1997

DOI: 10.1117/12.273731

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<title>Pulsed laser deposition of ferroelectric thin films for active microwave electronic devices</title>

J. S. Horwitz

Douglas B. Chrisey

A. C. Carter

et al.

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Influence of substrates on the statical and dynamical properties of ferroelectric thin films

Wesselinowa¹,

Dimitrov

2007

Physica Status Solidi (b)

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Based on the transverse Ising model using a Green's function technique it is shown that the influence of the substrate induces strong changing of various statical and dynamical properties due to different exchange interactions between the ferroelectric thin film and the substrate. Properties such as the phase transition temperature, the polarization, the soft-mode energy, the damping and the dielectric function were found to be highly dependent upon the magnitude and the kind (tensile or compressive) of the stress due to the substrate. There is some competition between the surface and substrate effects.

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Influence of substrates on the statical and dynamical properties of ferroelectric thin films

Wesselinowa¹,

Dimitrov

2007

Physica Status Solidi (b)

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Confocal scanning optical microscopy of BaxSr1−xTiO3 thin films

Hubert

Levy

Carter

et al. 1997

Applied Physics Letters

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An optical technique based on confocal scanning optical microscopy (CSOM) is used to image the ferroelectric polarization of BaxSr1−xTiO3 (BST) thin films at room temperature with submicron spatial resolution. BST films were grown by pulsed laser deposition on (100) SrTiO3 and MgO substrates at 750 °C in 300 mTorr of oxygen and postdeposition annealed in flowing oxygen at temperatures ⩽1250 °C. Films of both paraelectric (x=0.5) and ferroelectric (x=0.8) compositions show a coexistence of both paraelectric and ferroelectric phases. The ferroelectric regions exhibit polarization switching and hysteresis at relatively low (1–2 kV/cm) applied fields. These results suggest that nonuniform stress is responsible for the strong inhomogeneous thermal broadening of the ferroelectric phase transition, and that dielectric loss in thin films may be dominated by a relatively small fraction of nanometer-sized regions.

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Structural characterization of laser ablated epitaxial (Ba_0.5Sr_0.5)TiO₃ thin films on MgO(001) by synchrotron x-ray scattering

Kim

Kang

1999

J. Mater. Res.

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Epitaxial (Ba 0.5 Sr 0.5 ) TiO 3 thin films of two different thickness (∼25 and ∼134 nm) on MgO(001) prepared by a pulsed laser deposition method were studied by synchrotron x-ray scattering measurements. The film grew initially with a cube-on-cube relationship, maintaining it during further growth. As the film grew, the surface of the film became significantly rougher, but the interface between the film and the substrate did not. In the early stage of growth, the film was highly strained in a tetragonal structure (c/a ‫ס‬ 1.04) with the longer axis parallel to the surface normal direction. As the growth proceeded further, it relaxed to a cubic structure with the lattice parameter near the bulk value, and the mosaic distribution improved significantly in both in-and out-of-plane directions. The thinner film (∼25 nm) showed only one domain limited mainly by the film thickness, but the thicker film (∼134 nm) exhibited three domains along the surface normal direction.

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<title>Pulsed laser deposition of ferroelectric thin films for active microwave electronic devices</title>

Cited by 4 publications

References 0 publications

Influence of substrates on the statical and dynamical properties of ferroelectric thin films

Influence of substrates on the statical and dynamical properties of ferroelectric thin films

Confocal scanning optical microscopy of BaxSr1−xTiO3 thin films

Structural characterization of laser ablated epitaxial (Ba_0.5Sr_0.5)TiO₃ thin films on MgO(001) by synchrotron x-ray scattering

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Product

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About

<title>Pulsed laser deposition of ferroelectric thin films for active microwave electronic devices</title>

Cited by 4 publications

References 0 publications

Influence of substrates on the statical and dynamical properties of ferroelectric thin films

Influence of substrates on the statical and dynamical properties of ferroelectric thin films

Confocal scanning optical microscopy of BaxSr1−xTiO3 thin films

Structural characterization of laser ablated epitaxial (Ba0.5Sr0.5)TiO3 thin films on MgO(001) by synchrotron x-ray scattering

Contact Info

Product

Resources

About

Structural characterization of laser ablated epitaxial (Ba_0.5Sr_0.5)TiO₃ thin films on MgO(001) by synchrotron x-ray scattering