&lt;title&gt;Static fatigue of silica fibers&lt;/title&gt;

Poulain, Marcel; Evanno, N.; Gouronnec, Alain

doi:10.1117/12.481338

Cited by 3 publications

(1 citation statement)

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“…There is a significant research on reliability and proof-testing of optical fibers (see, e.g., [26][27][28][29][30][31][32][33][34][35][36]). Using the BAZ model, the condition at failure is obvious, and the equation ( 6) can be assumed in the form:…”

Section: Static Fatigue Lifetime Of An Optical Fiber Proof-tested At ...mentioning

confidence: 99%

Failure Oriented Accelerated Testing (FOAT), Boltzmann Arrhenius Zhurkov Equation (BAZ), and their Application in Aerospace Microelectronics and Photonics Reliability Engineering

Suhir¹

2019

IJASAR

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The best engineering product is, in effect, the best compromise between its cost, time-to-market and reliability. No successful compromise can be achieved nor can an adequate performance of an electronic or photonic product be assured, if the product's reliability is not quantified. Since nothing is perfect, and the difference between a highly reliable product and an insufficiently reliable one is "merely" in the difference between the levels of their never-zero probabilities of failure, reliability of such products should be evaluated on the probability basis. In the analysis that follows it is shown how this could be done using highly focused and highly cost effective failure-oriented accelerated testing (FOAT) geared to a physically meaningful and flexible Boltzmann-Arrhenius-Zhurkov (BAZ) constitutive equation. FOAT and BAZ are the core of the recently suggested probabilistic design for reliability (PDfR) concept. The following practically important problems are addressed, as suitable examples of the general concept: assessment of the static fatigue lifetime of an optical specialty-fiber intended for high-temperature operations; predicted time-to-failure (TTF) of an electron device subjected to temperature cycling; TTF of a solder material subjected to the combined action of low-temperatures and random-vibrations; and TTF of an electron device under the combined action of an elevated humidity and voltage. Future work should include experimental verification of the theoretical findings, as well as new applications of the suggested technique.

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Section: Static Fatigue Lifetime Of An Optical Fiber Proof-tested At ...mentioning

confidence: 99%

Failure Oriented Accelerated Testing (FOAT), Boltzmann Arrhenius Zhurkov Equation (BAZ), and their Application in Aerospace Microelectronics and Photonics Reliability Engineering

Suhir¹

2019

IJASAR

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Progress in reliability of silica optical fibres

Severin

Poulain

Abdi

2008

Optical Sensors 2008

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Reliability Estimation of Bent Optical Fibers in Harsh Environments

Tachikura

Kawai

2012

Trans.JSME, Ser.A

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Nowadays, bend-insensitive silica optical fibers are innovating on optical fiber access networks and applications.However the radical decrease of the bending radius may cause delayed failure of the fibers when they are used in harsh environments, because the conventional theories to estimate the mechanical reliability of the bent portion are not applicable to such environments. Though one of the authors has driven an enhanced equation applicable to the fibers in high temperature and/or high humidity environments, the equation is not easy to evaluate because it requires numerical integration. We propose another simpler equation that we have driven from commonly-used conventional equations.Calculations for specific conditions were carried out using the parameters extracted from an empirical formula. It was found that the new equation can be much improved in precision by applying a correction coefficient to the proof test parameter in the equation. Accordingly, the reliability calculation can be easily carried out without numerical integration.

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<title>Static fatigue of silica fibers</title>

Cited by 3 publications

References 0 publications

Failure Oriented Accelerated Testing (FOAT), Boltzmann Arrhenius Zhurkov Equation (BAZ), and their Application in Aerospace Microelectronics and Photonics Reliability Engineering

Failure Oriented Accelerated Testing (FOAT), Boltzmann Arrhenius Zhurkov Equation (BAZ), and their Application in Aerospace Microelectronics and Photonics Reliability Engineering

Progress in reliability of silica optical fibres

Reliability Estimation of Bent Optical Fibers in Harsh Environments

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