2005
DOI: 10.1117/12.639993
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<title>The X pinch as an x-ray source for point-projection radiography</title>

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Cited by 10 publications
(2 citation statements)
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“…[3][4][5][6][7] The side-on backlighting system has been achieved in many universities and national laboratories for the r-z profile measurements of Z-pinch plasmas. [4,5,[8][9][10][11][12][13] Images taken from the r-θ plane are quite necessary for quantitative measurements of the axial distribution of the Z-pinch plasma density. Thus, it is useful to design an axial (end-on) backlighting system.…”
Section: Introductionmentioning
confidence: 99%
“…[3][4][5][6][7] The side-on backlighting system has been achieved in many universities and national laboratories for the r-z profile measurements of Z-pinch plasmas. [4,5,[8][9][10][11][12][13] Images taken from the r-θ plane are quite necessary for quantitative measurements of the axial distribution of the Z-pinch plasma density. Thus, it is useful to design an axial (end-on) backlighting system.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3] This puts the expensive crystal at high risk for destruction when the plasma under study produces significant debris. However, in cases where the plasma of interest radiates intensely, as with wire array z-pinches, x-pinches, or hohlraum studies, traditional point-projection radiography may not work.…”
Section: Introductionmentioning
confidence: 99%