1997
DOI: 10.1117/12.292722
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<title>X-ray diffraction computed tomography: a survey and description</title>

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Cited by 5 publications
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“…The former can be overcome by using an intense and well defined incident beam, like those obtained at a synchrotron. This paper deals specifically with X-ray diffraction (XRD) scatter tomography as has been previously demonstrated (Harding et al, 1987;Grant et al, 1995;Kleuker, 1997). In this method the scattered radiation originates from diffracted X-rays from crystalline regions within the object.…”
Section: Introductionmentioning
confidence: 99%
“…The former can be overcome by using an intense and well defined incident beam, like those obtained at a synchrotron. This paper deals specifically with X-ray diffraction (XRD) scatter tomography as has been previously demonstrated (Harding et al, 1987;Grant et al, 1995;Kleuker, 1997). In this method the scattered radiation originates from diffracted X-rays from crystalline regions within the object.…”
Section: Introductionmentioning
confidence: 99%
“…Material-selective images were obtained by tomographically reconstructing the azimuthally integrated signal in angular intervals that contained a material-specific diffraction maximum. By reconstructing images from the attenuation-corrected signals sampled in all angular intervals, radial profiles can be locally reassembled from the pixel values of those images (Kleuker 1997). Recently, Westmore et al (1997) showed that, using a least-squares fit (LSF), material-selective images can be obtained by decomposing these restored radial profiles pixel-by-pixel using the known diffraction profiles, here called basis functions, of the components in the sample.…”
Section: Introductionmentioning
confidence: 99%