Luminance degradation test and life prediction of LED light at conventional stress using TPWRAM

Zhang, Jianping; Zhang, Yuying

doi:10.1007/s10854-023-11531-2

J Mater Sci: Mater Electron

2023

DOI: 10.1007/s10854-023-11531-2

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Luminance degradation test and life prediction of LED light at conventional stress using TPWRAM

Jianping Zhang,

Yuying Zhang

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Cited by 3 publications

References 25 publications

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Constant-Stress ADTs and Weibull-Based Lifetime Estimation of LED Lamp

Wang,

Zhang,

Wang

et al. 2024

J. Electron. Mater.

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Constant-Stress ADTs and Weibull-Based Lifetime Estimation of LED Lamp

Wang,

Zhang,

Wang

et al. 2024

J. Electron. Mater.

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Light emitting diode degradation and failure occurrence modelling based on accelerated life test

Vališ,

Forbelská,

Vintr

et al. 2025

Engineering Failure Analysis

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Overview of high-power LED life prediction algorithms

Sun,

Bai,

Zhang

2024

Front. Sustain. Energy Policy

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Life prediction significantly influences the reliability of LED light sources. While high-power LED light sources theoretically offer a lifespan of up to 100,000 h, irreversible damage to components leads to light failure, substantially reducing their actual lifespan. Consequently, accurate life prediction is pivotal for manufacturers to cut costs and enhance economic efficiency. This necessity aligns with the interests of communities, governments, and consumers. Currently, the most extensively employed prediction methods are based on traditional physical models and data-driven approaches. The focal point of current research lies in realizing model fusion, presenting both a hotspot and a challenge. To elucidate the relationships, advantages, and disadvantages of different algorithms and establish the groundwork for LED life prediction algorithm development, this paper first introduces material properties and the light decay model of high-power LED light sources. Subsequently, it discusses the principles and methods of the physical model concerning light source reliability. The paper also presents a review and comparison of recent domestic and foreign light source life prediction models. Finally, it provides insights into the expected future development trends in life prediction.

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Luminance degradation test and life prediction of LED light at conventional stress using TPWRAM

Cited by 3 publications

References 25 publications

Constant-Stress ADTs and Weibull-Based Lifetime Estimation of LED Lamp

Constant-Stress ADTs and Weibull-Based Lifetime Estimation of LED Lamp

Light emitting diode degradation and failure occurrence modelling based on accelerated life test

Overview of high-power LED life prediction algorithms

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