2002
DOI: 10.1063/1.1498960
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Luminescence studies of a Si/SiO2 superlattice

Abstract: Photoluminescence and electroluminescence from a Si/SiO2 superlattice have been measured. They show similar characteristics and exhibit an inhomogeneously broadened photoluminescence band peaked at 2.06 eV. The excitation spectrum indicates that excitations occur in the Si layers. The insensitivity of the luminescence spectrum and decay to temperature and excitation wavelength suggests that luminescence originates from transitions between localized defect states. These localized states are most likely defect s… Show more

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Cited by 77 publications
(61 citation statements)
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“…The strong fluctuations of the electronic gap with the nanocrystal size could be responsible for the large broadening of the PL spectra that have been observed experimentally, also at low temperatures. 3,5,6,8,9,12,[43][44][45][46][47][48][49] …”
Section: Discussionmentioning
confidence: 99%
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“…The strong fluctuations of the electronic gap with the nanocrystal size could be responsible for the large broadening of the PL spectra that have been observed experimentally, also at low temperatures. 3,5,6,8,9,12,[43][44][45][46][47][48][49] …”
Section: Discussionmentioning
confidence: 99%
“…4,7,10,12,46,47 Moreover, the presence of other oxygen-bond types is frequently reported in experimental samples, beside the single-bond type discussed here. Several works report the Si-O-Si bridge bond as the most stable configuration, and the Si=O double bond as the less energetically favoured.…”
Section: Oxidation and Strainmentioning
confidence: 99%
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“…In order to understand the electrical and optical properties of the device, we calculate the distribution of bias voltage across the LED. 5,7,[13][14][15] Figure 4 shows the band diagrams of the LED at a negligible current ͑10 A͒ under forward and reverse biases. Here, we approximate the Si-nc/ SiO 2 matrix as a uniform SiO 2 thin film with a dielectric constant of ϳ5 measured by ellipsometry.…”
mentioning
confidence: 99%