2022
DOI: 10.1155/2022/7205380
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Machine Learning and Statistical Methods for Studying Voids and Photothermal Effects of a Semiconductor Rotational Medium with Thermal Relaxation Time

Abstract: Machine learning is the process of creating algorithms that extract useful facts from data automatically. The goal of this paper is to use an artificial neural network and a cubic spline model to predict various physical quantities displacement components in a thermoplastic solid, such as elastic waves, vector form, volume fraction field, thermal waves, stress components, and carrier density concentration (plasma waves). The mean absolute scaled error (MASE), the mean absolute percentage error (MAPE), and the … Show more

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Cited by 2 publications
(2 citation statements)
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References 27 publications
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“…Their model was based on an original deep unfolding neural network (USRNet) [22]. Jawa et al have used machine learning and statistical methods for studying voids and photothermal effects of a semiconductor rotational medium with thermal relaxation time [23]. Kovács et al [24] have investigated deep learning approaches, based on U-net [25], for recovering initial temperature profiles from thermographic images in non-destructive material testing.…”
Section: Introductionmentioning
confidence: 99%
“…Their model was based on an original deep unfolding neural network (USRNet) [22]. Jawa et al have used machine learning and statistical methods for studying voids and photothermal effects of a semiconductor rotational medium with thermal relaxation time [23]. Kovács et al [24] have investigated deep learning approaches, based on U-net [25], for recovering initial temperature profiles from thermographic images in non-destructive material testing.…”
Section: Introductionmentioning
confidence: 99%
“…Khalil et al [13] studied electromagnetic field and initial stress on a photothermal semiconducting void medium under thermoelasticity theories. Jawa et al [14] produced machine learning and statistical methods for studying voids and photothermal effects of a semiconductor rotational medium with thermal relaxation time.…”
Section: Introductionmentioning
confidence: 99%