Magnetic and structural characteristics of ion beam sputter deposited Co-Cr thin films

Gill, H. S.; Rosenblum, Martin

doi:10.1109/tmag.1983.1062737

Cited by 18 publications

(2 citation statements)

References 4 publications

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“…To enhance the crystal nucleation with the c-axis perpendicular to the substrate surface, underlayer materials were investigated around middle 1980's, and the materials like hcp-Ta 27) , hcp-Ti 28,29) , amorphous-Ge 30) were found suitable for this purpose. The underlayer has to offer a surface condition for Coalloy crystal to nucleate with the basal (0001) parallel to the surface through hetero-epitaxial growth.…”

Section: Introductionmentioning

confidence: 99%

Development of Media Nanostructure for Perpendicular Magnetic Recording

Futamoto

Ohtake

2017

J. Magn. Soc. Jpn.

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The review covers the research and development of perpendicular media nanostructure focusing on the recording layer. The recording layer material includes the Co-alloys with hcp structure, the magnetic multilayers, and the alloys with ordered structures that have high magneto-crystalline anisotropies (Ku). The technologies of underlayer or interlayer for aligning the easy magnetization axis of magnetic crystal grain perpendicular to the film plane are briefly reviewed including the high Ku magnetic materials for future recording media.Observations of compositional and magnetization structures in sub-µm scale have played important roles in improving the recording layer. Typical data on these characteristics are explained in relation to the media structure improvements. Considering that high Ku magnetic materials will be employed in future recording media, basic experimental results related in controlling the easy magnetization axis and in keeping the surface flatness of L10-ordered magnetic materials are explained. Future possibilities for increasing the areal density beyond 1 Tb/in 2 by improving the magnetic material and the nanostructure of recording layer are also discussed.

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Section: Introductionmentioning

confidence: 99%

Development of Media Nanostructure for Perpendicular Magnetic Recording

Futamoto

Ohtake

2017

J. Magn. Soc. Jpn.

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“…The structure of perpendicular recording media are reported to be influenced by their underlayers (6,(9)(10)(11). This implies that the microstructure can be controlled by the selection of the underlayer.…”

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Structural Control of Electroless‐Plated Magnetic Recording Media by Underlayers

Matsubara

Toda

Sakuma³

et al. 1989

J. Electrochem. Soc.

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The structural control of electroless-plated CoP film was investigated using underlayers of electroless-plated CoNiMnP and CoNiP films. The CoNiMnP film showed a high degree of orientation of the hcp Co c-axis normal to the film plane, whereas the CoNiP film hardly sl:owed any preferred orientation. The CoP film plated onto the CoNiMnP underlayer showed a high degree of preferred orientation, while the CoP film plated onto the CoNiP underlayer showed a low degree of preferred orientation. Thus, the microstructure of the CoP film is clearly influenced by the underlayer structure. In the case of the CoP film onto the CoNiMnP underlayer, an epitaxial-like growth was observed up to a thickness of 0.25 ~m, and this reduced to the intrinsic microstructure at a thickness of 0.5 ~rn. Recording characteristics were measured on the 5 in. flexible disks, fabricated by plating the high-oriented CoP film or the low-oriented CoP film with a ringtype head of a commercial VHS video head. Perpendicular recording was performed on the high-oriented CoP fihn to demonstrate the best characteristics. The use of an oriented underlayer is thus confirmed to be a useful method of controlling the structure of the magnetic film in addition to controlling the bath plating parameters.

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Formation of Texture in Co/Cr Films for Perpendicular Magnetic Recording

Hergt

Pfeiffer

Fritzsch

1986

phys. stat. sol. (a)

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Texture formation in sputter deposited Co/Cr films is investigated in dependence on film thickness and substrate temperature by means of electron microscopy, electron diffraction, X‐ray diffraction, and magnetic measurements. In films deposited at 350 K film texture forms very rapidly within a transition layer thickness of about 50 nm beginning already in the noncontinuous growth stages below about 10 nm. In films deposited at higher substrate temperatures (up to 550 K) texture formation is much slower combined with a smaller grain size in the continuous film. The corresponding thicker transition layer causes a large in‐plane component of magnetization which essentially degrades the suitability of such films for perpendicular magnetic recording. The texture formation is interpreted as a selection process driven by free energy contributions from grain surfaces, interfaces, and boundaries.

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Magnetic and structural characteristics of ion beam sputter deposited Co-Cr thin films

Cited by 18 publications

References 4 publications

Development of Media Nanostructure for Perpendicular Magnetic Recording

Development of Media Nanostructure for Perpendicular Magnetic Recording

Structural Control of Electroless‐Plated Magnetic Recording Media by Underlayers

Formation of Texture in Co/Cr Films for Perpendicular Magnetic Recording

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