“…Fe layers (27 nm thick) were evaporated, at room temperature and at normal incidence with respect to the Si(111) substrate surface. This deposition geometry prevents the formation of an anisotropic roughness, which can lead to some specific magnetic anisotropy properties [16][17][18]. The atomic structure of the Fe films has been previously determined on the basis of LEED, X-ray photoelectron diffraction (XPD) and X-ray diffraction (XRD) measurements [19][20][21].…”