Voltage
control of room-temperature ferromagnetism has remained a big challenge
which will greatly influence the multifunctional memory devices. In
this paper, porous TiO2 thin films were deposited by dc-reactive
magnetron sputtering onto ordered porous anodic alumina (PAA) substrates.
Voltage-driving room-temperature resistance and magnetization switching
without external magnetic field are simultaneously found in an Ag/TiO2/PAA/Al (Ag/TP/Al) device. Further analysis indicates that
the formation/rupture of oxygen vacancy defect-based conductive filaments
would be responsible for the changes of resistivity and magnetization.
Our present results suggest that the TP nanoporous composite film
material may therefore be used to achieve voltage control of magnetism
and resistance switching in the future multifunctional memory devices.
The Ag/TP/Al devices can also be used for new spintronic devices,
neuromorphic operations, and alternative logic circuits and computing.