2020
DOI: 10.1103/physrevmaterials.4.094401
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Magnetic compensation at two different composition ratios in rare-earth-free Mn4xCoxN ferrimagnetic films

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Cited by 21 publications
(13 citation statements)
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“…There was not much difference in the XAS spectra of all the samples. The obtained XAS spectra are quite similar to those at the Mn L 2,3 absorption edges in (Mn,Ni) 4 N [25] and (Mn,Co) 4 N [26] epitaxial layers. A distinct shoulder is observed in the XAS spectra at a 2 eV higher energy than the main peaks of L 3 edges in all the films, as denoted by the arrows.…”
Section: Resultssupporting
confidence: 66%
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“…There was not much difference in the XAS spectra of all the samples. The obtained XAS spectra are quite similar to those at the Mn L 2,3 absorption edges in (Mn,Ni) 4 N [25] and (Mn,Co) 4 N [26] epitaxial layers. A distinct shoulder is observed in the XAS spectra at a 2 eV higher energy than the main peaks of L 3 edges in all the films, as denoted by the arrows.…”
Section: Resultssupporting
confidence: 66%
“…In figure 4, the sign of ρ AHE reverses between x = 0.15 and 0.27, and remains unchanged at x = 0.41. Such sign reversal in ρ AHE is generally recognized as the MC point in ferrimagnets [9,10], as well as in (Mn,Ni) 4 N and (Mn,Co) 4 N [25,26]. This result shows that the relative orientation of magnetic moment of Mn(II) atoms changes with respect to the magnetization between x = 0.15 and 0.27, which confirms the reversal of the magnetic moment of Mn(II) atoms, marked by peak β, between figures 3(b) and (c).…”
Section: Resultsmentioning
confidence: 97%
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“…The magnetic compensation in ferrimagnets is suitable for applying to magnetization switching due to the reduction of critical switching current density [99,100]. Mitarai et al studied the magnetic compensation in Co x Mn 4−x N films in 2020 [101]. The 30 nm thick Co x Mn 4−x N films with x varied from 0 to 1.3 were deposited on STO (001) substrates by MBE.…”
Section: Co and Ni Dopingmentioning
confidence: 99%
“…). [33][34][35] The AHE loops in a wide temperature range (5-300 K) for the Mn 4 N (30 nm) films can be found in Figure S2 of Supporting Information. The metallic behavior of the Mn 4 N (30 nm) is also revealed by performing a temperature-dependent electrical resistivity measurement (R − T), as shown in Figure 2D.…”
Section: Mnimentioning
confidence: 99%