1959
DOI: 10.1063/1.1735233
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Magnetic Domain Observations by Electron Microscopy

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Cited by 161 publications
(38 citation statements)
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“…Imaging of magnetic domain walls has been one of the main features of the Fresnel mode of Lorentz microscopy in the transmission electron microscope (TEM) since its inception [1]. A number of authors have used this technique to infer the domain wall width from images taken at different values of defocus with good agreement between experiment and theory [2,3].…”
Section: Introductionmentioning
confidence: 99%
“…Imaging of magnetic domain walls has been one of the main features of the Fresnel mode of Lorentz microscopy in the transmission electron microscope (TEM) since its inception [1]. A number of authors have used this technique to infer the domain wall width from images taken at different values of defocus with good agreement between experiment and theory [2,3].…”
Section: Introductionmentioning
confidence: 99%
“…[10][11][12][13] Lorentz images recorded in Fresnel mode is generally used to determine the magnetic domain walls imaged as black and white lines within a uniform grey background when the TEM is operated at a slightly defocused condition. 14) In order to avoid the loss of original domain structure in a strong magnetic field produced by a conventional objective lens, a switch-off objective lens or a magnetically shielded objective lens is necessary for the observation of magnetic microstructure. The simplest way to study technical magnetization process in TEM is to use a perpendicular magnetic field produced by the objective lens itself.…”
Section: Methodsmentioning
confidence: 99%
“…То, что сдвиг фаз определяется не силой Лоренца, а потоком, было показано экспериментально 13~20 при наблюдении электронных интерференционных картин В электронной микроскопии, так же как и в обычной микроско-пии, для наблюдения чисто фазовых объектов необходимы специальные режимы работы Этим и можно объяснить сравнительно недавнее начало использования просвечивающего микроскопа для наблюдения магнитных структур ТМП 21 -24 . Сейчас же практически все серийные микроскопы приспособлены для проведения таких наблюдений 21 · 24 -39 . 1.…”
Section: режим работы просвечивающего микроскопа при отображении маunclassified