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In situ investigation of displaced chain walls in 80 at% Ni Permalloy under applied in-plane magnetic field has been carried out by out-offocus methods of Lorentz electron microscopy. The magnetic flux in the plane of the film is schematically illustrated. The in-plane magnetic field applied to the foil is produced by a homemade magnetizing stage. By adjusting magnitude and direction of the electric current through the coils of the magnetizing stage, the magnetization reversal process of the magnetic domain wall has been in situ observed.

A novel method was reported to measure the remnant magnetic field in Lorentz mode in a FEI Tecnai F20 transmission electron microscope equipped with a Lorentz lens. The movement of the circle Bloch line of the cross-tie wall in Permalloy is used to measure the remnant magnetic field by tilting the specimen and adjusting the objective lens current. The remnant magnetic field is estimated to be about 17 Oe, in a direction opposite to that of the objective lens magnetic field. The remnant magnetic field can be compensated by adjusting the value of the objective lens current.