Transmission Electron Microscopy

Wang, Rongming; Tao, Jing; Du, Kui; Wang, Yumei; Ge, Binghui; Li, Fanghua; Liu, Wei; Liu, Haihua; Zhang, Ying; Yao, Yuan; Duan, Xiaofeng

doi:10.1007/978-981-13-0454-5_3

Cited by 7 publications

(5 citation statements)

References 324 publications

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“…Sampling the reflected or transmitted electrons, SEM and (high resolution, HR-) TEM are commonly utilized in confirming exterior morphology and imaging the lattice structures with sub-atom resolution. Meanwhile, high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) can give further insight in 3D morphology and element composition, for it employs Z-contrast imaging [78].…”

Section: Electron Probingmentioning

confidence: 99%

Low Pt Alloyed Nanostructures for Fuel Cells Catalysts

2018

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Low-noble metal electrocatalysts are attracting massive attention for anode and cathode reactions in fuel cells. Pt transition metal alloy nanostructures have demonstrated their advantages in high performance low-noble metal electrocatalysts due to synergy effects. The basic of designing this type of catalysts lies in understanding structure-performance correlation at the atom and electron level. Herein, design threads of highly active and durable Pt transition metal alloy nanocatalysts are summarized, with highlighting their synthetic realization. Microscopic and electron structure characterization methods and their prospects will be introduced. Recent progress will be discussed in high active and durable Pt transition metal alloy nanocatalysts towards oxygen reduction and methanol oxidation, with their structure-performance correlations illustrated. Lastly, an outlook will be given on promises and challenges in future developing of Pt transition metal alloy nanostructures towards fuel cells catalysis uses.

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Section: Electron Probingmentioning

confidence: 99%

Low Pt Alloyed Nanostructures for Fuel Cells Catalysts

2018

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“…The chemical information and images of NMs at a spatial resolution of atomic dimension are provided using TEMs. In general, there are two different modes in TEMs: a fixed-beam mode (conventional TEM, CTEM) and a rastered-beam mode (STEM) [165] . Modern TEMs equipped with scanning coils are capable of both modes of operation.…”

Section: Characterizations Of Nano-structural Propertiesmentioning

confidence: 99%

“…A thin sample, typically less than 200 nm, is bombarded by a highly focused beam of single-energy electrons. The beam has enough energy for the electrons to be transmitted through the sample, and the transmitted or scattered electron signal is greatly magnified by a series of electromagnetic lenses [165,166] . The basic functions of CTEM are summarized in Table 4.…”

Section: Conventional Tem Techniquesmentioning

confidence: 99%

“…Nowadays, a C s -corrected STEM instrument can provide a resolution better than 0.05 nm. Furthermore, a combined use with EDS or EELS, which uses electrons transmitted through the center hole of the annular dark-field (ADF) detector, enables element analysis column by column [165,166] .…”

Section: Stem Techniquesmentioning

confidence: 99%

“…Over the past few years, the C s -corrected STEM methods have become a cornerstone of FE-HfO 2 thin films and devices characterization owing to its ability to offer direct pictures of the samples, which could provide valuable information for optimizing the growth process to achieve targeted properties [165,166] . Grimley et al systematically studied interphase boundaries and single phase domains in Gd:HfO 2 ferroelectric capacitors through C s -corrected STEM [26] , which were crucial to identify the ferroelectric material's mechanical and electrical responses.…”

Section: Journal Ofmentioning

confidence: 99%

See 2 more Smart Citations

Ferroelectricity of hafnium oxide-based materials: Current status and future prospects from physical mechanisms to device applications

Yang¹,

Yu²,

Li³

et al. 2023

J. Semicond.

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The finding of the robust ferroelectricity in HfO2-based thin films is fantastic from the view point of both the fundamentals and the applications. In this review article, the current research status of the future prospects for the ferroelectric HfO2-based thin films and devices are presented from fundamentals to applications. The related issues are discussed, which include: 1) The ferroelectric characteristics observed in HfO2-based films and devices associated with the factors of dopant, strain, interface, thickness, defect, fabrication condition, and more; 2) physical understanding on the observed ferroelectric behaviors by the density functional theory (DFT)-based theory calculations; 3) the characterizations of microscopic and macroscopic features by transmission electron microscopes-based and electrical properties-based techniques; 4) modeling and simulations, 5) the performance optimizations, and 6) the applications of some ferroelectric-based devices such as ferroelectric random access memory, ferroelectric-based field effect transistors, and the ferroelectric tunnel junction for the novel information processing systems.

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Fabrication of Large‐Area Uniform Nanometer‐Thick Functional Layers and Their Stacks for Flexible Quantum Dot Light‐Emitting Diodes

Zhang

Wei

et al. 2021

Small Methods

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Large‐area fabrication and stacking of various nanometer‐thick functional layers from solutions is essentially important for the construction of flexible thin‐film optoelectronic devices, but very challenging. The existing fabrication methods suffer from either non‐uniformity caused by the coffee‐ring effect or serious solution waste (excess of 90% for spin coating), and are hard to scale up and create stacks. Here, it is shown that centrifugal casting is a universal, scalable, and efficient method to fabricate uniform nanometer‐thick films and their stacks of various materials. The coffee‐ring effect is effectively suppressed, the solution utilization ratio is higher than ≈61%, and the films/stacks show a smooth surface/high‐quality interface. Using this method, flexible quantum dot light‐emitting diode displays with uniform luminance in a large lighting area of ≈115 cm2 that have not been achieved even on rigid substrates by the existing methods, are realized. This efficient and low‐cost solution processing method paves a way for large‐area fabrication of various flexible thin‐film optoelectronic devices.

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Transmission Electron Microscopy

Cited by 7 publications

References 324 publications

Low Pt Alloyed Nanostructures for Fuel Cells Catalysts

Low Pt Alloyed Nanostructures for Fuel Cells Catalysts

Ferroelectricity of hafnium oxide-based materials: Current status and future prospects from physical mechanisms to device applications

Fabrication of Large‐Area Uniform Nanometer‐Thick Functional Layers and Their Stacks for Flexible Quantum Dot Light‐Emitting Diodes

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