Magnetic force microscopy of thin Permalloy films

Mamin, H. J.; Rugar, D.; Stern, J. E.; Fontana, R.E.; Kasiraj, P.

doi:10.1063/1.101898

Cited by 132 publications

(40 citation statements)

References 14 publications

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“…Sensitivity, determined by m, would be orders of magnitude larger than tips coated with paramagnetic films and in strong magnetic fields could approach or exceed that of available ferromagnetic-coated tips. These tips might also be useful for nonperturbative imaging of domain patterns in low coercivity films, 5 due to the lower stray fields emanating from these tips. 1 In contrast to the assumed fixed moment m of the ferromagnetic-coated tips, m of the superparamagnetic tips can increase with field.…”

mentioning

confidence: 99%

Superparamagnetic magnetic force microscopy tips

Hopkins¹,

Moreland²,

Malhotra

et al. 1996

Journal of Applied Physics

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We report on magnetic force microscopy (MFM) images of a thin-film magnetic recording head taken using batch micromachined silicon tips coated with nanocomposite Fe60(SiO2)40 and Fe70(SiO2)30 films. The small Fe grain size (<10 nm) and dilute Fe volume fraction (0.29–0.4) of these granular films produce tip coatings of low remanence and essentially zero coercivity, reduced by the superparamagnetic properties of these films. We have used these tips to obtain MFM images of the write field of the head with high spatial and magnetic-field resolution. In comparison to images taken using commercial Co85Cr15-coated tips, these MFM images show reduced tip memory effects and clearly delineate the gap field from the pole pieces.

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mentioning

confidence: 99%

Superparamagnetic magnetic force microscopy tips

Hopkins¹,

Moreland²,

Malhotra

et al. 1996

Journal of Applied Physics

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“…However, it has been found that the interpretation of MFM images can be complicated due to artifacts arising from the MFM tip field [2]. The situation is even more complex when the MFM imaging is carried out in the presence of external bias fields [3].…”

Section: U321mentioning

confidence: 97%

Direct and Real-Time Observation of Sub-Micron Domain Dynamics in Magnetically Biased Strontium Ferrite Permanent Magnets by Room Temperature Scanning Micro-Hall Probe Microscopy

et al. 2001

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A room temperature scanning micro-Hall probe microscope (RT-SHPM) was used for imaging stray magnetic field fluctuations at the surfaces of strontium ferrite permanent magnets (SFM) in the presence of external bias fields. The RT-SHPM enables the extremely fast, non-invasive, and quantitative measurement of localized surface magnetic fields on the sub-micron-scale. A 0. with magnetic field fluctuations of ±100G. Pronounced domain movement and rotation was observed for surfaces normal to the easy axis at bias fields above 700 Oe applied along the easy axis. A good correlation was found between domain movement and vibrating sample magnetometer hysteresis measurements. The RT-SHPM system was demonstrated to be a valuable tool for the direct and non-invasive study of micro-magnetic phenomena in ferromagnetic materials. INTRODUCTIONThe development of ferromagnetic materials for high performance permanent magnets requires a fundamental understanding of the behavior magnetic domains in external bias fields.

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“…These films were sputter coated (Plasma Sciences Inc. CrC-100 Sputtering System) on glass substrates. Of slightly more interest would be permalloy [12], an alloy containing about 20% iron and 80% nickel, which is notable for its extremely high permeability.…”

Section: Thin Filmsmentioning

confidence: 99%

Development of a Hybrid Atomic Force and Scanning Magneto-Optic Kerr Effect Microscope for Investigation of Magnetic Domains

Lawrence¹

2000

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We present the development of a far-field magneto-optical Kerr effect microscope.An inverted optical microscope was constructed to accommodate Kerr imaging and atomic force microscopy. In Kerr microscopy, magnetic structure is investigated by measuring the polarization rotation of light reflected from a sample in the presence of a magnetic field. Atomic force microscopy makes use of a probe which is scanned over a sample surface to map the topography. The design was created virtually in SolidWorks, a three-dimensional computer-aided drafting environment, to ensure compatibility and function of the various components, both commercial and custommachined, required for the operation of this instrument. The various aspects of the microscope are controlled by custom circuitry and a field programmable gate array data acquisition card at the direction of the control code written in National Instrument LabVIEW. The microscope has proven effective for both Kerr and atomic force microscopy. Kerr images are presented which reveal the bit structure of magnetooptical disks, as are atomic force micrographs of an AFM calibration grid. Also discussed is the future direction of this project, which entails improving the resolution of the instrument beyond the diffraction limit through near-field optical techniques.Preliminary work on fiber probe designs is presented along with probe fabrication work and the system modifications necessary to utilize such probes.i Acknowledgments I wish to thank the members of the Sánchez Nano-Development Lab in the physics department of Portland State University. This work could not have been successful without their continued advice and support. These include undergraduate research students

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Magnetic force microscopy of thin Permalloy films

Cited by 132 publications

References 14 publications

Superparamagnetic magnetic force microscopy tips

Superparamagnetic magnetic force microscopy tips

Direct and Real-Time Observation of Sub-Micron Domain Dynamics in Magnetically Biased Strontium Ferrite Permanent Magnets by Room Temperature Scanning Micro-Hall Probe Microscopy

Development of a Hybrid Atomic Force and Scanning Magneto-Optic Kerr Effect Microscope for Investigation of Magnetic Domains

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