Magnetic force microscopy of thin film media for high density magnetic recording

Porthun, S.; Abelmann, Léon; Lodder, Cock

doi:10.1016/s0304-8853(97)01010-x

Cited by 135 publications

(88 citation statements)

References 117 publications

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“…Single-domain superparamagnetic magnetite particles have not been studied before with this technique. Previous studies on MFM were focused mainly on magnetic recording media (5) and multidomain magnetic materials (6,7) as well as on tip characterization (8) and image interpretation (9,10). Closer to our work, there were reported the imaging and remagnetization of Co magnetic dots (with lateral dimensions of 140 × 250 nm) (11) and imaging and magnetic moment estimation of magnetotactic bacteria (50 nm in length and 17.5 nm in radius, if modeled as a cylinder) (12).…”

Section: Introductionmentioning

confidence: 53%

Atomic Force Microscopy and Magnetic Force Microscopy Study of Model Colloids

Raşa

Kuipers

Philipse

2002

Journal of Colloid and Interface Science

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Atomic force microscopy (AFM) is used to study the size, shape, and polydispersity of a variety of magnetic and nonmagnetic model colloids, previously imaged by transmission electron microscopy (TEM) only. Both height and phase images are analyzed and special attention is given to 3D morphology and softness of particles, as well as structures and presence of secondary components in the colloid, difficult to investigate with TEM. Several methods of tip characterization followed by deconvolution were applied in order to improve the accuracy of lateral diameter determination. In the case of magnetite particles dispersed in conventional ferrofluids, we explore both experimentally and theoretically the possibility of using magnetic force microscopy (MFM). We propose and discuss several models which allow to estimate the magnetic moment of a single domain superparamagnetic sphere using MFM, which cannot be done with other techniques; alternatively the tip magnetization can be determined. C 2002 Elsevier Science (USA)

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Section: Introductionmentioning

confidence: 53%

Atomic Force Microscopy and Magnetic Force Microscopy Study of Model Colloids

Raşa

Kuipers

Philipse

2002

Journal of Colloid and Interface Science

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“…This stimulated the measurement of magnetic [7][8][9][10] and electrostatic forces [11][12][13] and led to the development of magnetic force, electric force, and Kelvin probe microscopy [14]. The goal was not so much to understand the force but to image the distribution of magnetization, charge, or surface potential, respectively.…”

Section: Introductionmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,246

2,949

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“…All magnetic phase measurements were scanned over a scan area of 2.5 Â 2.5 mm 2 at a lift height of $90 nm to avoid the interference of van der Waals forces or AFM signals (as van der Waals forces are known to be effective only up to a distance of $ 10 nm). [29] Figures 5(a) and 5(b) and 6(a) and (b) show the MFM images (of the top scan of the structures, facing CoFe films) along with their corresponding line scan analysis for CoFe/ p-Si and CoFe/n-Si interfacial structures, respectively. Clear bright and dark contrast has been observed for both the structures.…”

Section: Afm Studymentioning

confidence: 99%

Magnetic, morphological and structural investigations of CoFe/Si interfacial structures

Kumar

Srivastava

2014

Journal of Experimental Nanoscience

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CoFe/Si interfacial structures have been realised by electron beam evaporation of CoFe magnetic alloy on p-and n-Si substrates. These realised interfacial structures have been characterised from X-ray diffraction (XRD), atomic force microscopy (AFM), magnetic force microscopy (MFM) and magnetisation (M-H) characteristics. XRD data have shown the presence of CoFe (bcc phase) and b-FeSi 2 phases for CoFe/p-Si interfacial structures, whereas CoFe/n-Si interfacial structures have shown the presence of CoFe (bcc and fcc) phases along with Fe 3 Si, e-FeSi and b-FeSi 2 silicide phases having nanodimension crystallites. The M-H characteristics have shown the superparamagnetic type behaviour for CoFe/p-Si structure, whereas CoFe/n-Si structure shows a feature of interfacial antiferromagnetic (AF) coupling. The observed magnetic behaviour has been understood due to the presence of various magnetic phases and their nanosized grains. The MFM data of domain size have also been correlated with the observed magnetic behaviour. CoFe/n-Si structures have shown a significant feature of giant magnetoresistance (GMR) as compared to CoFe/p-Si structures. It has been found that CoFe/p-Si structures show a distinctly different behaviour than CoFe/n-Si structures for their chemical structure, morphology and magnetic behaviour.

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Magnetic force microscopy of thin film media for high density magnetic recording

Cited by 135 publications

References 117 publications

Atomic Force Microscopy and Magnetic Force Microscopy Study of Model Colloids

Atomic Force Microscopy and Magnetic Force Microscopy Study of Model Colloids

Force measurements with the atomic force microscope: Technique, interpretation and applications

Magnetic, morphological and structural investigations of CoFe/Si interfacial structures

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