Magnetic impurity scattering and DMR in highly dilute CuFe systems

Accurate measurements of the low-temperature thermal conductivity of high-purity copper have revealed abrupt changes in the temperature dependence of the inelastic electron-phonon scattering component of the thermal resistivity ( 8'~) at about 7-, 11, and 18 K. The existence of these regions and the deviation of the form of the ratio p"/Wz (where p" is the normal electron-phonon scattering coniponent of the electrical resistivity) in the two lower regions from that in the two upper regions requires a reassessment of the natures and forms of the electron scattering processes in Cu.

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Magnetic impurity scattering and DMR in highly dilute CuFe systems

Cited by 2 publications

References 7 publications

Strain-induced changes in the temperature-dependent component of the electrical resistivity of Cu

Strain-induced changes in the temperature-dependent component of the electrical resistivity of Cu

Anomalies in the low-temperature thermal and electrical resistivities of copper

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