2006
DOI: 10.1016/j.jallcom.2005.12.100
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Magnetization study of interlayer exchange in semiconductor EuS–PbS ferromagnetic wedge multilayers

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(2 citation statements)
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“…The results of careful X-ray diffraction analysis of structural parameters of the EuS-PbS wedge multilayers are presented in Ref. [13]. The diffraction spectra reveal in the EuS-PbS wedge superlattices satellite peaks up to the 4th order indicating the high crystal quality and excellent agreement of EuS-PbS superlattice period with technological data from in situ quartz layer thickness monitor.…”
Section: Methodsmentioning
confidence: 97%
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“…The results of careful X-ray diffraction analysis of structural parameters of the EuS-PbS wedge multilayers are presented in Ref. [13]. The diffraction spectra reveal in the EuS-PbS wedge superlattices satellite peaks up to the 4th order indicating the high crystal quality and excellent agreement of EuS-PbS superlattice period with technological data from in situ quartz layer thickness monitor.…”
Section: Methodsmentioning
confidence: 97%
“…3). The coercive field of the layers shows only small increase in the same range of spacer thicknesses [13]. For the experimental analysis of the magnetic hysteresis loops along the wedge structure MOKE magnetometry was applied in the temperature range T = 4-30 K and magnetic fields up to 300 Oe using He-Ne laser.…”
Section: Methodsmentioning
confidence: 99%