2021
DOI: 10.1103/physrevb.104.064403
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Magnetoelasticity of Fe1xGax thin films on amorphous substrates

Abstract: In this work, we study the magnetoelastic behavior of Fe 1−x Ga x (0.11 < x < 0.19) thin films, grown on glass and oxidized Si(100) amorphous substrates, that present an isotropic crystalline texture in the film plane. The magnetoelastic coupling coefficients are obtained through the cantilever deflection technique. We find that the magnetoelastic response is larger for samples grown on glass with respect to those grown on Si(100), and such a response increases for larger Ga concentrations for both substrates … Show more

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Cited by 2 publications
(3 citation statements)
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“…Also, a small additional peak (marked with blue asterisks) corresponding to the reflection (222) of the D0 3 ordered phase is observed for FG30-Si-RT and FG30-Si-250 samples. We have discussed the occurrence of this reflection in previous works [14,40], and we concluded that the coexistence of phases A 2 + D0 3 is expected for this concentration in the metastable phase diagrams of the Fe 1−x Ga x alloy. It is interesting to note that the increase in Ga promotes an improvement in the crystallinity of the samples that is characterized by fine and intense peaks (see blue diffractograms), probably favored by the A 2 + D0 3 metastable phase.…”
Section: Compositionmentioning
confidence: 56%
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“…Also, a small additional peak (marked with blue asterisks) corresponding to the reflection (222) of the D0 3 ordered phase is observed for FG30-Si-RT and FG30-Si-250 samples. We have discussed the occurrence of this reflection in previous works [14,40], and we concluded that the coexistence of phases A 2 + D0 3 is expected for this concentration in the metastable phase diagrams of the Fe 1−x Ga x alloy. It is interesting to note that the increase in Ga promotes an improvement in the crystallinity of the samples that is characterized by fine and intense peaks (see blue diffractograms), probably favored by the A 2 + D0 3 metastable phase.…”
Section: Compositionmentioning
confidence: 56%
“…The films were deposited in a vacuum chamber under base pressure < 1.5 × 10 −6 Torr, in which the argon pressure was set at 2.7 mTorr, and the sputtering power at 20 W. The deposition process was previously optimized [14,25,35] resulting in the following deposition rates for the respective target: R 0.17 ∼ 0.136 nm s −1 , R 0.25 ∼ 0.144 nm s −1 and R 0.3 ∼ 0.156 nm s −1 . The films studied in this work were labeled taking into account the type and temperature of the substrate, in addition to the nominal target Ga concentration, as summarized in table 1.…”
Section: Methodsmentioning
confidence: 99%
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