The magnetoresistance ͑MR͒ studies of magnetite thin films deposited on vicinal MgO substrates show an enhanced MR along the miscut direction as compared to the direction perpendicular to it. The MR anisotropy increases with the decrease in temperature and peaks at the Verwey transition. The increase in magnetoresistance and anisotropy behavior is attributed to the formation of a greater number of out-of-plane shifted antiphase boundaries due to the step edges on vicinal MgO substrates. These local electronic and spin structure modifications at the APBs introduce additional spin scattering and are responsible for the increase in MR along the miscut. © 2005 American Institute of Physics. ͓DOI: 10.1063/1.1850361͔
INTRODUCTIONRecently, there has been considerable interest in the growth of magnetic thin films on vicinal surfaces owing to the intriguing physics involved and technological potential. [1][2][3][4] The studies on vicinal surfaces have been carried out mainly to understand the effect of lateral modulation of the electronic structure induced by step edges on the magnetic anisotropies. 3,4 In our previous publication we haveshown that the growth of Fe on stepped Mo ͑110͒ substrates leads to the formation of self-assembled nanowedges of size 20-40 nm and a switching of the magnetic easy axis from along the step edges to direction perpendicular to them.
3There are few reports on the study of magnetoresistance properties of thin films grown on vicinal surfaces.
EXPERIMENTThe Fe 3 O 4 thin films were grown on ͑100͒ oriented MgO single crystal substrates using an oxygen plasma assisted molecular beam epitaxy ͑MBE͒ system ͑DCA MBE M600, Finland͒ with a base pressure 5 ϫ 10 −10 Torr. Details of the film growth procedure are given elsewhere. 15 In situ reflection high energy electron diffraction ͑RHEED͒ was used to confirm epitaxial growth and also the growth mode. From the RHEED intensity oscillations it was found that the films grew in a layer-by-layer mode ͑at a rate of 0.3 Å / s. In the present study we report results obtained on two representative samples named, sample A and sample B, in which the MgO ͑100͒ substrates have nominal miscut of 0.5°͑±0.05°͒ and 2°͑±0.05°͒ along ͗011͘ directions. Structural characterization of the samples was performed using a high-resolution x-ray diffractometer ͑HRXRD, Bede-D1, UK͒. Miscut of the samples was determined from the variation in Bragg angle for the symmetric diffraction for different azimuth.Electrical resistivity and magnetoresistance ͑MR͒ measurements were carried out in the standard dc four probe collinear configuration. A variable field ͑up to 2 T͒ permanent magnet ͑Model: MM 2000 26.5-001, Multimag Magnetic Solutions Ltd., Ireland͒ was used to apply magnetic fields in the desired orientation. The MR is defined as;where R͑H͒ and R͑0͒ are the resistance of the sample with and without field, respectively. To determine the magnetoresistance anisotropy, the measurements were carried out by passing current in two directions, which are orthogonal to each other, i.e., a...