Manipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: Role of defects and dynamics in the mechanical switching of atoms

Sweetman, Adam; Jarvis, Samuel; Danza, R.; Bamidele, Joseph; Kantorovich, Lev; Moriarty, Philip

doi:10.1103/physrevb.84.085426

Cited by 20 publications

(21 citation statements)

References 45 publications

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“…1). It has been shown that the structure of the rows may be locally manipulated by controlled tunnel-current injection [18], and we recently demonstrated that the buckling of the dimers can be toggled with atomic precision by direct application of mechanical force during NC-AFM [19–20]. In this paper we present imaging and force spectroscopy of the Si(100) surface at 5 K by qPlus [21] NC-AFM at zero applied bias, and investigate the influence of different apex types on the qualitative image appearance, and quantitative short-range tip–sample force and dissipation.…”

Section: Introductionmentioning

confidence: 99%

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

Sweetman¹,

Jarvis²,

Danza³

et al. 2012

Beilstein J. Nanotechnol.

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Summary Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remains poorly understood and is an active area of research both experimentally and theoretically. Recent work employing specially functionalised tips has provided additional impetus to elucidating the role of the tip apex in the observed contrast. Results: We present an analysis of the influence of the tip apex during imaging of the Si(100) substrate in ultra-high vacuum (UHV) at 5 K using a qPlus sensor for noncontact atomic force microscopy (NC-AFM). Data demonstrating stable imaging with a range of tip apexes, each with a characteristic imaging signature, have been acquired. By imaging at close to zero applied bias we eliminate the influence of tunnel current on the force between tip and surface, and also the tunnel-current-induced excitation of silicon dimers, which is a key issue in scanning probe studies of Si(100). Conclusion: A wide range of novel imaging mechanisms are demonstrated on the Si(100) surface, which can only be explained by variations in the precise structural configuration at the apex of the tip. Such images provide a valuable resource for theoreticians working on the development of realistic tip structures for NC-AFM simulations. Force spectroscopy measurements show that the tip termination critically affects both the short-range force and dissipated energy.

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Section: Introductionmentioning

confidence: 99%

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

Sweetman¹,

Jarvis²,

Danza³

et al. 2012

Beilstein J. Nanotechnol.

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“…However, the most exciting applications of either of the techniques are related to their ability to perform nanomanipulation [3][4][5] . Both lateral [6][7][8] and vertical [9][10][11] manipulations have been used to build bottom-up nanostructures on surfaces. The latter manipulation, where the manipulated atom is either dropped to or extracted from the surface, normally results in a modification of the tip apex with the concomitant change of the image contrast.…”

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confidence: 99%

Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism

et al. 2014

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Manipulation is the most exciting feature of the non-contact atomic force microscopy technique as it allows building nanostructures on surfaces. Usually vertical manipulations are accompanied by an abrupt tip modification leading to a change of contrast. Here we report on low-temperature experiments demonstrating vertical manipulations of 'super'-Cu atoms on the p(2 Â 1) Cu(110):O surface, both extractions to and depositions from the tip, when the imaging contrast remains the same. These results are rationalized employing a novel and completely general method that combines density functional theory calculations for obtaining energy barriers as a function of tip height and a Kinetic Monte Carlo algorithm for studying the tip dynamics and extraction of manipulation statistics. The model reveals a novel multistep manipulation mechanism combining activated jumps of 'super'-Cu atoms to/from the tip with their drag by and diffusion on the tip.

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“…2 are simulated F ( z ) curves taken with the H3 (a) and D 1 (b) tips positioned above the up (green and black triangles) and down (red and blue circles) atoms of a surface Si(100) dimer. An in-depth description of the origins of the calculated force profile have been given elsewhere [8,13,42]. The key points, however, are summarised below.…”

Section: Resultsmentioning

confidence: 99%

“…Through understanding the interactions between the AFM tip and sample surface, the chemical interactions present in AFM images [1–5], manipulation experiments [6–10], and, more recently, submolecular investigations of planar molecules [11–12], have been revealed. In covalent systems in particular, density functional theory (DFT) calculations have been extremely successful in explaining the fundamental interactions that underpin NC-AFM experiments [2–3 13–16]. Moreover, atomistic simulations remain essential to many current studies in covalent [17–19] and ionic [20–21] systems because of the inherent difficulties in determining the tip apex structure from purely experimental evidence.…”

Section: Introductionmentioning

confidence: 99%

“…In the current study we use the Si(100)-c(4×2) surface as a prototypical system, chosen because of its known dissipative behaviour in NCAFM experiments [8,13,37,39]. In particular, we have previously shown that a large variety of tip types are possible on the Si(100) surface, each demonstrating a different tip–sample interaction, and importantly, each exhibiting markedly different levels of measured dissipation [40].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Structural development and energy dissipation in simulated silicon apices

Jarvis¹,

Kantorovich²,

Moriarty³

2013

Beilstein J. Nanotechnol.

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In this paper we examine the stability of silicon tip apices by using density functional theory (DFT) calculations. We find that some tip structures -modelled as small, simple clusters -show variations in stability during manipulation dependent on their orientation with respect to the sample surface. Moreover, we observe that unstable structures can be revealed by a characteristic hysteretic behaviour present in the F(z) curves that were calculated with DFT, which corresponds to a tip-induced dissipation of hundreds of millielectronvolts resulting from reversible structural deformations. Additionally, in order to model the structural evolution of the tip apex within a low temperature NC-AFM experiment, we simulated a repeated tip-surface indentation until the tip structure converged to a stable termination and the characteristic hysteretic behaviour was no longer observed. Our calculations suggest that varying just a single rotational degree of freedom can have as measurable an impact on the tip-surface interaction as a completely different tip structure. 941

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Manipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: Role of defects and dynamics in the mechanical switching of atoms

Cited by 20 publications

References 45 publications

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism

Structural development and energy dissipation in simulated silicon apices

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