2009
DOI: 10.1016/j.ijfatigue.2009.01.020
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Mapping and load response of overload strain fields: Synchrotron X-ray measurements

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Cited by 37 publications
(26 citation statements)
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“…Although this capability exists in neutron diffraction facilities and some high energy synchrotron user facilities, no such capability exists for bench-top laboratory conditions [1][2][3][4][5]. Under Air Force funding, a new method was developed to measure strain depth profiles of shot peened surface treatments using standard NDE laboratory equipment [6].…”
Section: Introductionmentioning
confidence: 99%
“…Although this capability exists in neutron diffraction facilities and some high energy synchrotron user facilities, no such capability exists for bench-top laboratory conditions [1][2][3][4][5]. Under Air Force funding, a new method was developed to measure strain depth profiles of shot peened surface treatments using standard NDE laboratory equipment [6].…”
Section: Introductionmentioning
confidence: 99%
“…Two different families of techniques have been used, namely, synchrotron X-ray diffraction and displacement field measurement either by Digital Image Correlation (DIC) or tracking of individual markers. Synchrotron X-ray diffraction studies allow mapping the crack tip strain field [4][5][6][7]. This method is mainly applied to unloaded samples and it focuses on measurement of the residual strains in the wake and at the tip of a post overload fatigue crack with a rather coarse spatial resolution along the crack front where the strain is averaged through the sample thickness for 1-mm thick samples where plane stress should prevail [7] or sampled every 300 µm to understand the stronger crack retardation observed near the specimen edges [5].…”
Section: Introductionmentioning
confidence: 99%
“…Such diffraction studies bring valuable insight into the overload effect. For example, the post-overload residual strain was shown to persist after crack propagation with the overload response being "turned off" when loading above a critical load value [5]. However, no attempt was made to convert the measured strain maps into Stress Intensity Factors (SIFs) as has already been done in DIC studies.…”
Section: Introductionmentioning
confidence: 99%
“…Third generation synchrotron X-ray facilities allow experimental measurement of the strain at the interior of the specimen. Recent works have shown that it is possible to map in 2D the strain fields around the cracktip [3][4][5]. However, our highest spatial resolution measurements (25m) were made on a very fine grained Al-Li alloy, with low fracture toughness such that the plastic zone was very small.…”
Section: Introductionmentioning
confidence: 99%