Mapping the elemental distribution in sol‐gel derived ceramics

Abstract

Elemental dispersive x‐ray (EDX) composition distribution mapping using a scanning electron microscope (SEM) provides information about samples that is complementary to that obtained from X‐ray diffraction. Examples are given (e.g., Ba and Cu maps of YBa2Cu3O7 − δ, see figure) to demonstrate the usefulness of this technique in evaluating the homogeneity of sol‐gel products and in elucidating elemental zoning (see also cover picture). magnified image

Visualization of Compositional Fluctuations in Complex Oxides Using Energy-Filtering Transmission Electron Microscopy

“…This technique has been routinely used to explore a variety of materials in chemistry, geology, and biology. In materials science, for example, X-ray elemental mapping has been used to study local element distribution, diffusion processes, and chemical reactions at the micrometer scale . Unfortunately, this method has its limitations in quantitative microanalysis, as it lacks the resolution needed for the fine-scale microstructure of many materials.…”

Compositional Mapping by Laser-Induced Breakdown Spectroscopy

“…However, the measurable sensitivity of the EDX technique is limited only to about a few percent, and it becomes worse for the light elements because of their weak X-ray emission. Moreover, the EDX spectra can overlap between elements with K, L, and M shells of X-ray origins that tend to mislead the proper determination of chemical compositions . Other surface techniques are Auger electron spectroscopy (AES) and Rutherford backscattering (BRS) which use an electron and ion beam, respectively.…”