Mapping the mechanical action of light

Kohlgraf-Owens, Dana C.; Sukhov, Sergey; Dogariu, Aristide

doi:10.1103/physreva.84.011807

Cited by 19 publications

(14 citation statements)

References 19 publications

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“…Consequently, the averaged surface-induced force is relatively small because the surface forces depend strongly on the tip-sample separation. Thus, in these conditions the magnitudes of OIF become comparable to the surface forces present in typical experimental conditions [11,56,58,59].…”

Section: Effect Of Optically Induced Forcesmentioning

confidence: 58%

“…As the probe passes over the illumination, the total force gradient acting on the probe is increased because of the probe's exposure to the additional attractive contribution of the optical force gradient. The scanning system's feedback retracts the probe to reduce the contribution from the surface forces, thus maintaining a constant force gradient acting on the probe [11]. As a result, a topographic feature is recorded, which correlates with the field distribution across the surface.…”

Section: Optical Topographymentioning

confidence: 99%

“…For example, it was shown that such approach can be used for a quantitative measurement of the tip-optical interaction force [11]. A byproduct of this process is the possibility to determine the tip-sample separation, which can be simply determined by controllably varying the light intensity.…”

Section: Steady-state Oifmentioning

confidence: 99%

“…When the strength of these optical forces is comparable to the surface forces, they can induce a measureable effect upon the feedback mechanism. Readout of the changes in cantilever properties may be performed using optical detection [10], piezoelectric [10,11] or piezoresistive effects [12].…”

Section: Radiation Forces In Spmmentioning

confidence: 99%

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Optically induced forces in scanning probe microscopy

et al. 2014

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Typical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

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Section: Effect Of Optically Induced Forcesmentioning

confidence: 58%

Section: Optical Topographymentioning

confidence: 99%

Section: Steady-state Oifmentioning

confidence: 99%

Section: Radiation Forces In Spmmentioning

confidence: 99%

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Optically induced forces in scanning probe microscopy

et al. 2014

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“…The third is the development of normal force tuning-fork feedback which shows that the ultimate in force sensitivity with glass based multiprobes enabled probes for NSOM, electrical, thermal, plasmonic, ion conductance, fountain-pen nanolithography, and scanning electrochemical microscopy applications (http://www.nanonics.co.il/ products/spm-probes-and-nanotools.html). For example it has been shown that with such probes and the platform used in the present study, a force sensitivity of 1.6 pN could be achieved, which is more sensitive than any other AFM based feedback technique developed thus far [16].A major challenge that is pervasive in nearly all functional applications that include SPM is that the functional probes associated with these applications do not always achieve the ultimate in AFM topographic resolution. This is due to the additional dimensions inherent in some functional probes that are based on AFM feedback.…”

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confidence: 97%

Multiprobe NSOM fluorescence

et al. 2014

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Abstract:In this paper, we demonstrate simultaneous AFM/NSOM using a dual-tip normal tuning-fork based scanning probe microscope. By scanning two SPM probes simultaneously, one dedicated for AFM with a standard tip diameter of 20 nm, and the second having a 150 nm aperture NSOM fiber with 200 nm thick gold coating, we combine the benefits of ∼20 nm spatial resolution from the AFM tip with the spectral information of a near-field optical probe. The combination of simultaneous dual-tip scanning enables us to decouple the requirements for high resolution topography and probe functionality. Our method represents a marked shift from previous applications of multi-probe SPM where essentially a pump-probe methodology is implemented in which one tip scans the area around the second. As a model system, we apply dual-tip AFM/NSOM scanning to a sample of spin-cast nano-clustered Lumogen dyes, which show remarkable brightness and photochemical stability. We observe morphology features with a resolution of 20 nm, and a nearfield optical resolution of 150 nm, validating our approach.Keywords: multiprobe; NSOM; SPM; lumogen; FRET; tuning fork probe. a Shirly Berezin and Basanth S. Kalanoor contributed equally to this work *Corresponding author: Yaakov R. Tischler, Bar-Ilan Institute of Nanotechnology and Advanced Materials, Department of Chemistry, Bar-Ilan University, Ramat-Gan, 52900, Israel, e-mail: yrt@biu.ac.il Shirly Berezin and Yuval Garini: Bar-Ilan Institute of Nanotechnology and Advanced Materials, and Department of Physics, Bar-Ilan University, Ramat-Gan, 52900, Israel Basanth S. Kalanoor: Bar-Ilan Institute of Nanotechnology and Advanced Materials, and Department of Chemistry, Bar-Ilan University, Ramat-Gan, 52900, Israel Hesham Taha: Nanonics Imaging Ltd., Jerusalem, 97775, Israel Edited by Aaron Lewis 1 IntroductionAtomic force microscopy (AFM) since its introduction in 1986 [1] has been limited in its technology to single probes investigating a sample surface. Nonetheless, the goal of achieving multiprobe AFM operation was a most desirable objective which was difficult to achieve. This article describes the application of a highly developed multiprobe platform and one of its applications to near-field scanning optical microscopy (NSOM). In this particular application, we demonstrate that such a platform can readily address the dichotomy between achieving the best NSOM resolution while not sacrificing on the on-line AFM resolution of the structure.The development of mulitiprobe scanning probe microscopy (SPM) technology based on AFM was quite complex. This complexity arose from a complicated interaction between probe technology, feedback technology, and the geometry of the construction of the SPM.The history of such multiprobe technology was therefore initially based on scanning tunneling microscopy and the guiding of the probes to relatively close proximity was defined by an on-line scanning electron microscope. There are several reports on the development of multiprobe STM equipped with up to four probes [2][3]...

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