2002
DOI: 10.1016/s0304-3991(02)00151-1
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Mapping the mesoscale interface structure in polycrystalline materials

Abstract: A new experimental approach to the quantitative characterization of polycrystalline microstructure by scanning electron microscopy is described. Combining automated electron backscattering diffraction with conventional scanning contrast imaging and with calibrated serial sectioning, the new method (mesoscale interface mapping system) recovers precision estimates of the 3D idealized aggregate function G(x). This function embodies a description of lattice phase and orientation (limiting resolution approximately … Show more

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Cited by 15 publications
(7 citation statements)
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“…For tilted samples, distortion of EBSD images has been pointed out [16,17], and a geometric transformation has been proposed to correct the distortion based on SEM images on non tilted samples. The tilt correction has since been incorporated as a basic function in standard SEMs.…”
Section: Introductionmentioning
confidence: 99%
“…For tilted samples, distortion of EBSD images has been pointed out [16,17], and a geometric transformation has been proposed to correct the distortion based on SEM images on non tilted samples. The tilt correction has since been incorporated as a basic function in standard SEMs.…”
Section: Introductionmentioning
confidence: 99%
“…A very similar way was described by WU et al 3 However, this will finally correct unknown effects which are caused by the microscope system and specific constant environmental conditions. A further but little discussed problem is the correct alignment of the sample.…”
Section: Introductionmentioning
confidence: 81%
“…Former allows for a spatial distortion correction of EBSD data proposed by Nolze (2007); Kapur & Casasent (2000); Wu et al (2002). To reduce imaging-induced distortions in the SEM reference (1), high magnifications, long dwell times, and low working distances were utilized as suggested in Kammers & Daly (2013).…”
Section: Methodsmentioning
confidence: 99%