Masking of X-values by Use of a Hierarchically Configurable Register

Rabenalt, Thomas; Goessel, M.; Leininger, A.

doi:10.1109/ets.2009.11

Cited by 10 publications

(1 citation statement)

References 13 publications

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“…The selective X-masking logic is applied to mask the majority of X's, after that the output responses go through to the X-tolerant compactor[13] [16] which can tolerate the remained X's in the test responses. The main objective of this approach is to improve efficiency by masking the scan chains selectively as well as improve the observability of the test responses.…”

Section: Introductionmentioning

confidence: 99%

A selective X-masking for test responses in the presence of unknown values

Shubing

Reungpeerakul

2011

The 8th Electrical Engineering/ Electronics, Computer, Telecommunications and Information Technology (ECTI) Association of Thai

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As the unknown values (X's) appear in the output response, a large amount of scan cells may not be observed during test. In this paper we present a flexible X-masking logic called selective X-masking to handle the majority of X's, while the X-tolerant compactor is applied to handle the remained X's.The objective of this approach is to improve the observability of the test responses. The results show that this scheme can achieve a significant improvement of observability for output responses and reduce significantly the data overhead of the X-masking.

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Section: Introductionmentioning

confidence: 99%

A selective X-masking for test responses in the presence of unknown values

Shubing

Reungpeerakul

2011

The 8th Electrical Engineering/ Electronics, Computer, Telecommunications and Information Technology (ECTI) Association of Thai

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On Determining the Real Output Xs by SAT-Based Reasoning

Elm

Kochte

Wunderlich

2010

2010 19th IEEE Asian Test Symposium

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Embedded testing, built-in self-test and methods for test compression rely on efficient test response compaction. Often, a circuit under test contains sources of unknown values (X), uninitialized memories for instance. These X values propagate through the circuit and may spoil the response signatures. The standard way to overcome this problem is X-masking.Outputs which carry an X value are usually determined by logic simulation. In this paper, we show that the amount of Xs is significantly overestimated, and in consequence outputs are overmasked, too. An efficient way for the exact computation of output Xs is presented for the first time. The resulting X-masking promises significant gains with respect to test time, test volume and fault coverage.

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