1972
DOI: 10.1109/tmtt.1972.1127796
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Matrix Methods for Microstrip Three-Dimensional Problems

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Cited by 78 publications
(8 citation statements)
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“…1 are widely used in various microwave devices, such as microstrip meander delay lines [1,2], slow-wave deflecting systems [3], metamaterials forming [4,5] etc. RMS are also successfully used for the analysis of physical models, for example, complex planar structures [6][7][8], microstrip discontinuities [9][10][11], etc. Main characteristics of an RMS are charge distribution on the microstrip section or total capacitance of this sec- * corresponding author; e-mail: edvardas.metlevskis@el.vgtu.lt tion.…”
Section: Introductionmentioning
confidence: 99%
“…1 are widely used in various microwave devices, such as microstrip meander delay lines [1,2], slow-wave deflecting systems [3], metamaterials forming [4,5] etc. RMS are also successfully used for the analysis of physical models, for example, complex planar structures [6][7][8], microstrip discontinuities [9][10][11], etc. Main characteristics of an RMS are charge distribution on the microstrip section or total capacitance of this sec- * corresponding author; e-mail: edvardas.metlevskis@el.vgtu.lt tion.…”
Section: Introductionmentioning
confidence: 99%
“…Evaluation of a capacitance for a round disk capacitor has been studied by some authors [1][2][3][4][5] who were willing to take into account the fringing field effects. In case no rigorous solutions are found, one should resort to approximate solutions, including numerical methods for capacitors with unknown solutions.…”
Section: Introductionmentioning
confidence: 99%
“…Plusieurs travaux basés sur le calcul de la densité de charge des lignes de transmission ont été effectués [1,2,3] et ont abouti à des expressions de capacités dépendant des dimensions du gap, de la constante diélectrique et de la hauteur du substrat semiconducteur.…”
Section: A Modélisation éLectrique En Obscuritéunclassified