Molecular Beam Epitaxy 1995
DOI: 10.1016/b978-081551371-1.50008-1
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MBE Growth of High Tc Superconductors

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Cited by 26 publications
(19 citation statements)
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“…By converting the Mg vapor pressure to Mg flux from the deposition source using the formulism described in Ref. [18], the film deposition parameters can then be determined. For example, at the optimum temperature of about 1350 K the Mg vapor pressure has to be in the range of 10 Torr, which is highly impossible for many film deposition techniques.…”
mentioning
confidence: 99%
“…By converting the Mg vapor pressure to Mg flux from the deposition source using the formulism described in Ref. [18], the film deposition parameters can then be determined. For example, at the optimum temperature of about 1350 K the Mg vapor pressure has to be in the range of 10 Torr, which is highly impossible for many film deposition techniques.…”
mentioning
confidence: 99%
“…Achieving such composition control has been a major problem in prior oxide MBE work [15]. We have met this challenge using a combination of AA (calibrated in situ using a QCM) and by monitoring the RHEED intensity oscillations that occur during the monolayer-bymonolayer deposition of SrTiO 3 and BaTiO 3 calibration layers.…”
Section: Methodsmentioning
confidence: 99%
“…There are steps with the height of a single unit cell on the surface corresponding to the layer-by-layer growth of the SrTiO atomic plane. And the area ratio of the higher terraces indicates the amount of the growing layer, i.e., ∼0.1 ML at t 4 and ∼0.6 ML at t 5 . While the step roughness changes dramatically, the high-resolution STM images show no detectable change of the area ratio of (5×1) and (4×1) reconstructions, i.e., the surface stoichiometry almost keeps unchanged.…”
Section: Fig 2 (A) and (B) Stm Images (Unoccupies-states)mentioning
confidence: 99%
“…2 Unlike the adsorption and incorporation processes during GaAs film growth in which only one low vapor pressure element Ga is involved and the stoichiometry can be obtained within the self-regulation mechanism, 3,4 the OMBE growth of complex oxide films involves multiple low vapor pressure metals and therefore requires precise flux control of each individual evaporating beam. [5][6][7][8] The in situ quartz crystal microbalance (QCM) or atomic absorption spectroscopy (AAS) technique offers a few percent precision for the calibration of the flux rates of metal sources.…”
Section: Introductionmentioning
confidence: 99%
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