We propose a polarization-insensitive and high-efficiency plasmonic silicon Schottky diode for detection of sub-bandgap photons in the optical communication wavelength range through internal photoemission. Our photodiode is based on a hybrid plasmonic silicon waveguide. It has a gold film covering both the top and the sidewalls of a dielectric silicon waveguide with the Schottky contact formed at the gold-silicon interface. An extensive physical model is presented in detail and applied to calculate and analyze the performance of our detector. By comparison with a diode with only top contact of gold, the polarization sensitivity of responsivity is greatly minimized in our photodetector with sidewall coverage of gold.Much higher responsivities for both polarizations are also achieved in a very broad wavelength range of 1.2-1.5 μm. Moreover, the Schottky contact is only 4 μm long, leading to a very small dark current. Our design is very promising for practical applications in high-density silicon photonic integration.Internal photoemission (IPE) is an intrinsic property of a Schottky diode, occurring at a metal-semiconductor interface [1]. In IPE, three processes are involved.Firstly, an electron (hole) in the metal is excited to a higher level after absorbing a photon, becoming a hot electron (hot hole). Secondly, the hot carrier (electron or hole) travels to the metal-semiconductor interface. During its travel, the hot carrier may lose some energy due to scattering by cold carriers or by thermal relaxation. Finally, upon