1963
DOI: 10.1103/physrevlett.10.7
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Mean Free Path of Hot Electrons and Holes in Metals

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Cited by 42 publications
(13 citation statements)
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“…These predictions agree well with experiments [1,2,41] and Mohamed's model as well [2,41]. As the length increases further, the active number of free electrons becomes saturate due to the temporal and spatial correlation limited by the free path effect of electrons [42]. Our model taking the concept of the COFE correctly predicts that the OPL emission becomes saturate as the length of nanorod increases to about 50 nm [1,2,41].…”
Section: Modelsupporting
confidence: 87%
See 1 more Smart Citation
“…These predictions agree well with experiments [1,2,41] and Mohamed's model as well [2,41]. As the length increases further, the active number of free electrons becomes saturate due to the temporal and spatial correlation limited by the free path effect of electrons [42]. Our model taking the concept of the COFE correctly predicts that the OPL emission becomes saturate as the length of nanorod increases to about 50 nm [1,2,41].…”
Section: Modelsupporting
confidence: 87%
“…Clearly, the QY of a bulk film can be as low as 10 −8.5 and that of a single nanorod can be two to three orders higher. More importantly, our model correctly predicts the observed saturation of the QY of the OPL from a single gold nanorod [1] even without taking into account the free path effect of the electrons [42]. We find that the QY increases first when L is small and then becomes saturate at ∼ L s = 25 nm .…”
Section: Theoretical Prediction Of Quantum Yieldsupporting
confidence: 57%
“…However, other issues may arise in this case, which may prevent the device from reaching the predicted value of the limiting efficiency. Although previous work reported comparable mean free path ranges for the hot electrons and holes in Au, 21 recent calculations of the total relaxation times of hot charge carriers in gold show that hot holes arising from d states lose energy on a sub-5femtosecond time scale 27 , which makes hot d holes challenging to extract before thermalization. Some improvements to the limiting conversion efficiency may be achieved by the e-DOS modification via quantum confinement effects in low-dimensional Au absorbers 5,17 .…”
Section: Discussion and Outlookmentioning
confidence: 93%
“…To estimate the limiting efficiency, we assume that hot electrons travel ballistically to the junction and are subsequently emitted into the semiconductor to generate a photocurrent. This assumption can reasonably be applied in the cases when the thickness of the absorber is significantly thinner than the mean free path of the hot charge carrier, which for Au is about 40nm 21,22 . We also assume perfect momentum matching, which once again is justified for an Au absorber with characteristic dimensions much smaller that the carrier mean free path, as multiple reflections from the material interface increase the hot carrier emission probability.…”
Section: Full-spectrum Conversion Via Internal Photoemission Through mentioning
confidence: 99%
“…representing the number of round trips a hot carrier can travel back and forth in the Au film before its energy E 0 is reduced to Ф B and has no chance to jump over the Schottky barrier; L is the mean free path of 74 nm (55 nm) for an electron (a hole) in Au [18]. For a given Au-Si Schottky contact, Ф B is fixed (i.e.…”
mentioning
confidence: 99%