2003
DOI: 10.1117/12.473849
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Measurement methodology for vertically aligned nematic reflective displays

Abstract: We developed a measurement method for the characteristics of microdisplays specifically aimed at vertically aligned nematic reflective cells. It allows determination of contrast ratio and cell gap, and gives good estimates for the pretilt angle and the elastic surface-coupling constant. The set-up consists of a laser source, high quality polarisers, a beamsplitter mirror, a quarter-wave plate and a sensitive photodiode. A model for the polarization changes in the light caused by each component allows the extra… Show more

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Cited by 5 publications
(3 citation statements)
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“…A methodology for this was reported and used in Ref. 8. The light coming from the display is sent through a quarter-wave plate before being passed through the analyzer.…”
Section: Measuring Retardancementioning
confidence: 99%
See 1 more Smart Citation
“…A methodology for this was reported and used in Ref. 8. The light coming from the display is sent through a quarter-wave plate before being passed through the analyzer.…”
Section: Measuring Retardancementioning
confidence: 99%
“…A single-wavelength measuring method using a rotated wave plate developed for the vertically aligned mode was presented in Ref. 8. Like most of these methods, the determination of the two parameters remains somewhat interdependent, leading to a loss of accuracy.…”
Section: Introductionmentioning
confidence: 99%
“…The incidence angle is defined as the angle between the average material deposition direction on the substrate during the evaporation process and the substrate normal. Pre-tilt angles were measured directly on the actual cells using a phase-retardation technique 17 ; this methodology gives very accurate results.…”
Section: Deposition Techniquementioning
confidence: 99%