2011
DOI: 10.1088/1674-1056/20/4/040702
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Measurement of inner surface roughness of capillary by an x-ray reflectivity method

Abstract: The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope (AFM). The roughness measured by this new method can reach the order of angstroms with high quality capillaries.

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Cited by 7 publications
(5 citation statements)
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“…The roughness of the inner wall of the capillary used in this experiment is known to be smaller than 100 nm as the driving laser has been measured to be guided in matched capillary tubes according to theoretical predictions [19]. As the roughness of similar capillary tubes has been measured by Li et al [23] to be of the order of 1 nm, we evaluate in this section the fraction of the generated betatron radiation that would be reflected by a smooth capillary wall in our experimental conditions.…”
Section: Discussion Of X-ray Reflectionmentioning
confidence: 89%
“…The roughness of the inner wall of the capillary used in this experiment is known to be smaller than 100 nm as the driving laser has been measured to be guided in matched capillary tubes according to theoretical predictions [19]. As the roughness of similar capillary tubes has been measured by Li et al [23] to be of the order of 1 nm, we evaluate in this section the fraction of the generated betatron radiation that would be reflected by a smooth capillary wall in our experimental conditions.…”
Section: Discussion Of X-ray Reflectionmentioning
confidence: 89%
“…To further study the in‐plane anisotropic structure of b‐As 0.4 P 0.6 , we then measured the angle‐resolved polarized Raman spectroscopy (ARPRS) that can be used to obtain the symmetry of chemical bond vibration and determine orientation of crystal. [ 23–25 ] During the measurement, the polarization vector of incident laser (532 nm) was fixed along the horizontal direction, while the polarization vector of scattered light was parallel or cross to the incident laser by a polarization analyzer. Figure a shows the Raman spectrum in both parallel and cross configuration, showing the visibly discrepancy in intensity and position of Raman peaks.…”
Section: Resultsmentioning
confidence: 99%
“…In this zone, the system always remains in chaotic motion, which means that the signal cannot be detected by the phase transition. [22] ii) The critical threshold varies with the reference signal frequency and the intensity of the background noise. [23] iii) The frequency detection interval of a single Duffing oscillator is very narrow.…”
Section: Principles Of the Duffing Oscillatormentioning
confidence: 99%
“…However, this phase transition process is difficult to identify accurately, and the critical threshold corresponding to the critical state is greatly affected by many factors. [22] In addition, the inherent deficiencies of the conventional Duffing oscillator detection method, which is based on a strong refer-ence signal, were not considered. [23] In this investigation, our objective was to maximize the frequency detection interval of a single Duffing oscillator, while avoiding the effects of the inherent deficiencies of this method on the detection accuracy.…”
Section: Introductionmentioning
confidence: 99%