2014
DOI: 10.1364/oe.22.027373
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Measurement of large discontinuities using single white light interferogram

Abstract: White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram acquired with a single-chip color CCD camera for step height measurement which lies beyond the unambiguous range of the monochromatic interferometry. The color interferogram is decomposed and phase maps for red, green, and blue components are calculated independently using Hilbert transforma… Show more

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Cited by 31 publications
(25 citation statements)
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“…To implement FOM, phases measured at three different wavelengths are required. The phase is governed by the following equation [16,30,53,74] (…”
Section: 1(b) Fringe Order Methods (Fom)mentioning
confidence: 99%
See 2 more Smart Citations
“…To implement FOM, phases measured at three different wavelengths are required. The phase is governed by the following equation [16,30,53,74] (…”
Section: 1(b) Fringe Order Methods (Fom)mentioning
confidence: 99%
“…Single-shot measurements where only a single frame or multiple frames in one go are recorded and analyzed for phase by an appropriate procedure have been reported. In recent years, numerous single-frame analysis methods such as Fast Fourier Transform (FFT) [25][26][27], Huang-Hilbert transformation (HHT) [26,28], Hilbert Transform (HT) [29][30][31], Pixelatedpolarization phase shifting (PPPS) [20,32]etc. have been applied for single-interferogram analysis.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The height obtained by phase slope method is close to the actual value and it can be further improved. This value is used to estimate the fringe order ℱ N of the spectrally resolved interference signal, which is described by formula [13]…”
Section: Fringe Order Determinationmentioning
confidence: 99%
“…One of the limitations is that the phase difference between two adjacent points must be less than , limiting the measurement range. To overcome this limitation, vertical scanning is typically used [1][2][3][4][5]. Multi-wavelength interference microscope is the other approach [6][7][8].…”
Section: Introductionmentioning
confidence: 99%