Measurement of mechanical loss in the Acktar Black coating of silicon wafers

Abernathy, M. R.; Korth, W. Z.; Adhikari, R. X.; Prokhorov, L.; Koptsov, D. V.; Mitrofanov, V. P.

doi:10.1088/0264-9381/33/18/185002

Cited by 3 publications

(8 citation statements)

References 25 publications

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“…The mechanical loss angle of the carbon nanotube coating. φ c , can be written as a function of the difference between the measured mechanical loss of the bending modes of the coated and uncoated wafers [15,23]:…”

Section: Results Of Measurements and Discussionmentioning

confidence: 99%

“…The coefficient, k, is obtained from the FEM, assuming that the coating layer is described by equations of solid mechanics. For the thin coating layer, when t c t s , k ≈ 0.3 [15,23]. The coefficient k depends weakly on the value of the Poisson ratios ν s and ν c .…”

Section: Results Of Measurements and Discussionmentioning

confidence: 99%

“…The residual gas damping gives a negligible contribution to the measured mechanical loss. A more detailed description of the experimental setup and the measurement procedure can be found in [15].…”

Section: Methodsmentioning

confidence: 99%

“…An important consideration is the additional thermal noise associated with the mechanical loss in this coating. The mechanical loss of the Acktar Black coating was explored in [15], and it was shown that the Acktar coating results in a ∼9% increase of the total strain noise of LIGO Voyager. It is therefore interesting and important to explore other high-emissivity coatings that produce lower thermal noise.…”

Section: Introductionmentioning

confidence: 99%

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Measurement of mechanical losses in the carbon nanotube black coating of silicon wafers

Prokhorov¹,

Mitrofanov²,

Kamai³

et al. 2019

Class. Quantum Grav.

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The successful detection of gravitational waves from astrophysical sources carried out by the laser interferometric detectors LIGO and Virgo have stimulated scientists to develop a new generation of more sensitive gravitational wave detectors. In the proposed upgrade called LIGO Voyager, silicon test masses will be cooled to cryogenic temperatures. To provide heat removal from the test masses when they absorb the laser light one can increase their thermal emissivity using a special black coating. We have studied mechanical losses in a carbon nanotube black coating deposited on silicon wafers. The additional thermal noise associated with mechanical loss in this coating was calculated using a value of the product of the coating Young’s modulus and the coating mechanical loss angle determined from the measurements. It was found that at temperatures of about 123 K, the additional thermal noise of the LIGO Voyager test mass caused by the carbon nanotube black coating deposited on its barrel is less than the noise associated with the Acktar Black coating and is 20 times less than the noise due to the optical high reflective (HR) coating of the test mass.

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Section: Results Of Measurements and Discussionmentioning

confidence: 99%

Section: Results Of Measurements and Discussionmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Measurement of mechanical losses in the carbon nanotube black coating of silicon wafers

Prokhorov¹,

Mitrofanov²,

Kamai³

et al. 2019

Class. Quantum Grav.

Self Cite

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“…The mode polarization can be achieved in a range of mid infrared from a large silicon layer; nevertheless, the absorption of SiO2 is about 700 𝑑𝐵 𝑐𝑚 −1 𝑎𝑡 5 𝜇𝑚 [18]. Because sapphire (Al2O3) provides for high-confinement waveguides at wavelengths in the mid-infrared range, the insulator material switched from silicon dioxide (SiO2) to sapphire, but sapphire absorption smaller 1 𝑑𝐵 𝑐𝑚 −1 under 6 𝜇𝑚 wavelength.…”

Section: Waveguides Dispersionmentioning

confidence: 99%

Modal Analysis for Single-Mode Waveguides of Silicon on Sapphire (SOS) at Infrared Region Using Finite Element Method (FEM)

Shwan¹

2022

JASN

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One of the recommended platforms for waveguide generation in the infrared region is silicon-on-sapphire (SOS). This paper proposes a modal of the optical waveguide of silicon on a sapphire from λ = 2 − 5 𝜇𝑚, using FEM (finite-element method) solver simulation performed by FDTD [finite-different-time-domain]. The waveguide is directly based on the refractive index difference between the wave's guideline regions and surrounding media (cladding). The use of FEM to analyze a single waveguide mode of SOS at a certain size within multiple wavelengths is a unique aspect of this research. In addition, this project's objective is to discover how the waveguide size (dimension) impacts single-mode waveguides in the infrared region. The investigation includes single-mode polarization with both transverse-magnetic TM0 and transverse-electric TE0 polarization. The waveguide is reliant on the effective index of different mediums, and sizes of substances, they have a significant role in generating waveguide with minimum loss (minimum dispersion). The study's most crucial finding is that singlemode can be achieved in silicon with widths ranging from 0.4 − 4.5 𝜇𝑚 and height ranging from 0.4 − 0.7 𝜇𝑚 as well as analysis the characteristics of mode polarization and explain those parameters have a massive role in the waveguide like effective index, sizes of structure and wavelength. In keeping with our modal analysis, we also state the mode's characterization and direct some factors' influence on the waveguide.

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Upper limits on the mechanical loss of silicate bonds in a silicon tuning fork oscillator

et al. 2018

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Measurement of mechanical loss in the Acktar Black coating of silicon wafers

Cited by 3 publications

References 25 publications

Measurement of mechanical losses in the carbon nanotube black coating of silicon wafers

Measurement of mechanical losses in the carbon nanotube black coating of silicon wafers

Modal Analysis for Single-Mode Waveguides of Silicon on Sapphire (SOS) at Infrared Region Using Finite Element Method (FEM)

Upper limits on the mechanical loss of silicate bonds in a silicon tuning fork oscillator

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