Measurement of parameters of dielectric materials on characteristics of waveguide dielectric resonator

A fast and efficient method for permittivity measurement of thin‐film material

“…Dielectric permittivity is one of the significant parameters to describe the electromagnetic characteristics of materials and knowledge of the dielectric permittivity values of materials is a prerequisite step for many kinds of electromagnetic applications 1,2 . Approaches to characterize the dielectric permittivity of materials under test (MUT) are already well established, 3,4 which are typically categorized as resonant methods and nonresonant methods 5–15 . For resonant methods, they essentially include resonant perturbation methods and resonator methods, of which the measurement processes are complicated and inconvenient.…”

“…1,2 Approaches to characterize the dielectric permittivity of materials under test (MUT) are already well established, 3,4 which are typically categorized as resonant methods and nonresonant methods. [5][6][7][8][9][10][11][12][13][14][15] For resonant methods, they essentially include resonant perturbation methods and resonator methods, of which the measurement processes are complicated and inconvenient. In addition, both of them have a considerable restriction on the shapes of MUT for different kinds of measurement apparatus, especially for the resonant perturbation method.…”