2014 IEEE 16th Electronics Packaging Technology Conference (EPTC) 2014
DOI: 10.1109/eptc.2014.7028273
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Measurement of power distribution network impedance using an error analysis approach

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Cited by 5 publications
(3 citation statements)
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“…In this work, low-cost, professional-grade 6 GHz and 8.5 GHz PicoVNA ® Vector Network Analyzers (VNA) (Pico Technology, Cambridge, UK) and open-source software were selected to acquire the data. These instruments are based on time domain reflectometry and a non-destructive measurement method [ 45 , 46 ]. They calculate the impedance by analyzing the scattering (or S parameters) due to transmitted and reflected energy across the device under test (DUT).…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…In this work, low-cost, professional-grade 6 GHz and 8.5 GHz PicoVNA ® Vector Network Analyzers (VNA) (Pico Technology, Cambridge, UK) and open-source software were selected to acquire the data. These instruments are based on time domain reflectometry and a non-destructive measurement method [ 45 , 46 ]. They calculate the impedance by analyzing the scattering (or S parameters) due to transmitted and reflected energy across the device under test (DUT).…”
Section: Methodsmentioning
confidence: 99%
“…sional-grade 6 GHz and 8.5 GHz PicoVNA ® Vector Network Analyzers (VNA) (Pico T nology, Cambridge, UK) and open-source software were selected to acquire the These instruments are based on time domain reflectometry and a non-destructive m urement method [45,46]. They calculate the impedance by analyzing the scattering parameters) due to transmitted and reflected energy across the device under test (DU The measurement configuration is composed of the impedance analyzer conne to the coated sample over a plate capable of providing specific temperatures.…”
Section: Measurement Systemmentioning
confidence: 99%
“…For example, steadily advancing gate density and clock speed of modern ASIC's and FPGA's has led to new demands on their power distribution networks (PDNs). The need to maintain power integrity in the presence of high-speed current transients has forced designers to pay close attention to the impedance associated with both on-and off-chip PDN [1][2][3]. This often requires measurement of single-digit milli-ohm impedances that present substantial challenges using even the most advanced available test equipment [4].…”
mentioning
confidence: 99%